ASIC

PHY1

PHY2

FPGA

Oscillator

(156.25

MHz)

156.25 MHz

CDCLVD 1204

LVDSBuffer

IN_SEL

CDCLVD1204

www.ti.com

SCAS898A – MAY 2010 – REVISED JUNE 2010

2:4 Low Additive Jitter LVDS Buffer

Check for Samples: CDCLVD1204

1

FEATURES

DESCRIPTION

•

2:4 Differential Buffer

The CDCLVD1204 clock buffer distributes one of two

selectable clock inputs, (IN0, IN1), to 4 pairs of

•

Low Additive Jitter: <300 fs RMS in 10-kHz to

differential LVDS clock outputs (OUT0, OUT3) with

20-MHz

minimum

skew

for

clock

distribution.

The

•

Low Output Skew of 20 ps (Max)

CDCLVD1204 can accept two clock sources into an

•

Universal Inputs Accept LVDS, LVPECL, and

input multiplexer. The inputs can either be LVDS,

LVCMOS

LVPECL, or LVCMOS.

•

Selectable Clock Inputs through Control Pin

The CDCLVD1204 is specifically designed for driving

•

4 LVDS Outputs, ANSI EAI/TIA-644A Standard

50

Ω transmission lines. In case of driving the inputs

in single ended mode, the appropriate bias voltage

Compatible

•

Clock Frequency up to 800 MHz

input pin.

•

2.375 V–2.625 V Device Power Supply

The IN_SEL pin selects the input which is routed to

•

the outputs. If this pin is left open it disables the

Capacitive Coupled Inputs

outputs (static). The part supports a fail safe function.

•

Industrial Temperature Range: –40°C to 85°C

The device incorporates an input hysteresis which

prevents random oscillation of the outputs in the

•

Packaged in 3 mm × 3 mm 16-Pin QFN (RGT)

absence of an input signal.

•

ESD Protection Exceeds 3 kV HBM, 1 kV CDM

The device operates in 2.5V supply environment and

is characterized from –40°C to 85°C (ambient

APPLICATIONS

temperature). The CDCLVD1204 is packaged in

•

Telecommunications/Networking

small 16-pin, 3-mm × 3-mm QFN package.

•

Medical Imaging

•

Test and Measurement Equipment

•

Wireless Communications

•

General Purpose Clocking

Figure 1. Application Example

1

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas

Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

PRODUCTION DATA information is current as of publication date.

Copyright © 2010, Texas Instruments Incorporated

Products conform to specifications per the terms of the Texas

Instruments standard warranty. Production processing does not

necessarily include testing of all parameters.