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FDC2114QRGHRQ1 데이터시트(PDF) 5 Page - Texas Instruments |
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FDC2114QRGHRQ1 데이터시트(HTML) 5 Page - Texas Instruments |
5 / 60 page 5 FDC2112-Q1, FDC2114-Q1, FDC2212-Q1, FDC2214-Q1 www.ti.com SNOSCZ9 – MAY 2016 Product Folder Links: FDC2112-Q1 FDC2114-Q1 FDC2212-Q1 FDC2214-Q1 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated (1) Electrical Characteristics values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very limited self-heating of the device such that TJ = TA. No guarantee of parametric performance is indicated in the electrical tables under conditions of internal self-heating where TJ > TA. Absolute Maximum Ratings indicate junction temperature limits beyond which the device may be permanently degraded, either mechanically or electrically. (2) Register values are represented as either binary (b is the prefix to the digits), or hexadecimal (0x is the prefix to the digits). Decimal values have no prefix. (3) Limits are ensured by testing, design, or statistical analysis at 25°C. Limits over the operating temperature range are ensured through correlations using statistical quality control (SQC) method. (4) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary over time and also depend on the application and configuration. The typical values are not tested and are not ensured on shipped production material. (5) I2C read/write communication and pullup resistors current through SCL, SDA not included. (6) Sensor capacitor: 1 layer, 20.9 × 13.9 mm, Bourns CMH322522-180KL sensor inductor with L=18 µH and 33 pF 1% COG/NP0 Target: Grounded aluminum plate (176 × 123 mm), Channel = Channel 0 (continuous mode) CLKIN = 40 MHz, CHx_FIN_SEL = b10, CHx_FREF_DIVIDER = b00 0000 0001 CH0_RCOUNT = 0xFFFF, SETTLECOUNT_CH0 = 0x0100, DRIVE_CURRENT_CH0 = 0x7800. (7) Lower VSENSORMIN oscillation amplitudes can be used, but will result in lower SNR. 6.5 Electrical Characteristics Unless otherwise specified, all limits ensured for TA = 25°C, VDD = 3.3 V (1) PARAMETER TEST CONDITIONS(2) MIN(3) TYP(4) MAX(3) UNIT POWER VDD Supply voltage TA = –40°C to 125°C 2.7 3.6 V IDD Supply durrent (not including sensor current)(5) CLKIN = 10MHz(6) 2.1 mA IDDSL Sleep mode supply current(5) 35 60 µA ISD Shutdown mode supply current(5) 0.2 1 µA CAPACITIVE SENSOR CSENSORMAX Maximum sensor capacitance 1-mH inductor, 10-kHz oscillation 250 nF CIN Sensor pin parasitic capacitance 4 pF NBITS Number of bits FDC2112, FDC2114 RCOUNT ≥ 0x0400 12 bits FDC2212, FDC2214 RCOUNT = 0xFFFF 28 bits fCS Maximum channel sample rate FDC2112, FDC2114 single active channel continuous conversion, SCL = 400 kHz 13.3 kSPS FDC2212, FDC2214 single active channel continuous conversion, SCL= 400 kHz 4.08 kSPS EXCITATION fSENSOR Sensor excitation frequency TA = –40°C to 125°C 0.01 10 MHz VSENSORMIN Minimum sensor oscillation amplitude (pk)(7) 1.2 V VSENSORMAX Maximum sensor oscillation amplitude (pk) 1.8 V ISENSORMAX Sensor maximum current drive HIGH_CURRENT_DRV = b0 DRIVE_CURRENT_CH0 = 0xF800 1.5 mA HIGH_CURRENT_DRV = b1 DRIVE_CURRENT_CH0 = 0xF800 Channel 0 only 6 mA |
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