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전자부품 데이터시트 검색엔진 |
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전자부품 데이터시트 검색엔진 |
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SM72501 데이터시트(PDF) 3 Page - Texas Instruments |
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SM72501 데이터시트(HTML) 3 Page - Texas Instruments |
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3 / 28 page  SM72501 www.ti.com SNIS157C – JANUARY 2011 – REVISED APRIL 2013 3V Electrical Characteristics (1) Unless otherwise specified, all limits are specified for TA = 25°C, V + = 3V, V− = 0V, V CM = V +/2, and R L > 10 kΩ to V +/2. Boldface limits apply at the temperature extremes. Symbol Parameter Conditions Min(2) Typ(3) Max(2) Units VOS Input Offset Voltage ±37 ±200 μV ±500 TCVOS Input Offset Voltage Temperature See(4) ±1 ±5 μV/°C Drift IB Input Bias Current See(4)(5) ±0.2 ±1 −40°C ≤ TA ≤ 85°C ±50 pA See(4)(5) ±0.2 ±1 −40°C ≤ TA ≤ 125°C ±400 IOS Input Offset Current 40 fA CMRR Common Mode Rejection Ratio 0V ≤ VCM ≤ 3V 86 130 dB 80 PSRR Power Supply Rejection Ratio 2.7V ≤ V+ ≤ 12V, Vo = V+/2 86 98 dB 82 CMVR Common Mode Voltage Range CMRR ≥ 80 dB –0.2 3.2 V CMRR ≥ 77 dB –0.2 3.2 AVOL Open Loop Voltage Gain RL = 2 kΩ 100 114 VO = 0.3V to 2.7V 96 dB RL = 10 kΩ 100 124 VO = 0.2V to 2.8V 96 VOUT Output Voltage Swing High RL = 2 kΩ to V +/2 40 80 120 mV from V+ RL = 10 kΩ to V +/2 30 40 60 Output Voltage Swing Low RL = 2 kΩ to V +/2 40 60 80 mV RL = 10 kΩ to V +/2 20 40 50 IOUT Output Current(6)(7) Sourcing VO = V +/2 25 42 VIN = 100 mV 15 mA Sinking VO = V +/2 25 42 VIN = −100 mV 20 IS Supply Current 0.670 1.0 mA 1.2 SR Slew Rate(8) AV = +1, VO = 2 VPP 0.9 V/ μs 10% to 90% GBW Gain Bandwidth 2.5 MHz THD+N Total Harmonic Distortion + Noise f = 1 kHz, AV = 1, R.L = 10 kΩ 0.02 % en Input Referred Voltage Noise f = 1 kHz 9 nV/ √Hz Density in Input Referred Current Noise f = 100 kHz 1 fA/ √Hz Density (1) Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very limited self-heating of the device such that TJ = TA. Parametric performance is indicated in the electrical tables under conditions of internal self-heating where TJ > TA. (2) Limits are 100% production tested at 25°C. Limits over the operating temperature range are specified through correlations using the Statistical Quality Control (SQC) method. (3) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary over time and will also depend on the application and configuration. The typical values are not tested on shipped production material. (4) This parameter is specified by design and/or characterization and is not tested in production. (5) Positive current corresponds to current flowing into the device. (6) The maximum power dissipation is a function of TJ(MAX), θJA. The maximum allowable power dissipation at any ambient temperature is PD = (TJ(MAX) – TA)/ θJA. All numbers apply for packages soldered directly onto a PC Board. (7) The short circuit test is a momentary test. (8) The number specified is the slower of positive and negative slew rates. Copyright © 2011–2013, Texas Instruments Incorporated Submit Documentation Feedback 3 Product Folder Links: SM72501 |
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