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LM317MQDCYR 데이터시트(PDF) 4 Page - Texas Instruments |
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4 / 22 page LM317M SLVS297P – APRIL 2000 – REVISED MARCH 2014 www.ti.com 6.4 Thermal Information LM317M THERMAL METRIC(1) DCY UNIT 4 TERMINALS RθJA Junction-to-ambient thermal resistance 60.2 RθJCtop Junction-to-case (top) thermal resistance 42.0 RθJB Junction-to-board thermal resistance 9.4 °C/W ψJT Junction-to-top characterization parameter 3.4 ψJB Junction-to-board characterization parameter 9.3 RθJCbot Junction-to-case (bottom) thermal resistance n/a (1) For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953. 6.5 Electrical Characteristics over recommended operating virtual-junction temperature range, VI – VO = 5 V, IO = 0.1 A (unless otherwise noted) PARAMETER TEST CONDITIONS(1) MIN TYP MAX UNIT TJ = 25°C 0.01 0.04 Line regulation(2) VI – VO = 3 V to 40 V %/V Full temperature range 0.02 0.07 TJ = 25°C 0.1 0.5 Load regulation IO = 10 mA to 500 mA %VO Full temperature range 0.3 1.5 ADJUST terminal current 50 100 μA VI – VO = 3 V to 40 V, Change in ADJUST terminal current 0.2 5 μA IO = 10 mA to 500 mA VI – VO = 3 V to 40 V, Reference voltage 1.2 1.25 1.3 V IO = 10 mA to 500 mA Output-voltage temperature stability 0.7 % Minimum load current 3.5 10 mA to maintain regulation VI – VO ≤ 15 V 500 900 Maximum output current mA VI – VO = 40 V, PD ≤ PD(max), TJ = 25°C 150 250 RMS output noise voltage (% of VO) f = 10 Hz to 10 kHz, TJ = 25°C 0.003 %VO CADJ = 0 (3) 65 VO = 10 V, f = 120 Hz, Ripple rejection dB TJ = 25°C CADJ = 10 μF (3) 66 80 Long-term stability TJ = 25°C 0.3 1 %/1k hrs (1) Pulse-testing techniques are used to maintain the junction temperature as close to the ambient temperature as possible. (2) Line voltage regulation is expressed here as the percentage change in output voltage per 1-V change at the input. (3) CADJ is connected between the ADJUST terminal and ground. 4 Submit Documentation Feedback Copyright © 2000–2014, Texas Instruments Incorporated Product Folder Links: LM317M |
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