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LM4946 데이터시트(PDF) 10 Page - Texas Instruments |
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LM4946 데이터시트(HTML) 10 Page - Texas Instruments |
10 / 37 page LM4946 SNAS335E – JANUARY 2006 – REVISED AUGUST 2007 www.ti.com I 2C/SPI WQFN/DSBGA(1)(2) (continued) The following specifications apply for VDD = 5.0V and 3.3V, TA = 25°C, 2.2V ≤ I 2CSPI_V DD ≤ 5.5V, unless otherwise specified. Symbol Parameter Conditions LM4946(3) Units (Limits)(4) Typical(5) Limits(6) (2) tDH SPI Data Hold Time 100 ns (min) tEH SPI Enable Hold Time 100 ns (min) tCL SPI Clock Low Time 500 ns (min) tCH SPI Clock High Time 500 ns (min) 0.7xI2CSPI VIH I2C/SPI Input Voltage High V (min) VDD 0.3xI2CSPI VIL I2C/SPI Input Voltage Low V (max) VDD I 2C/SPI DSBGA only(1)(2) The following specifications apply for VDD = 5.0V and 3.3V, TA = 25°C, 1.7V ≤ I 2CSPI_V DD ≤ 2.2V, unless otherwise specified. Symbol Parameter Conditions LM4946 Units (Limits)(3) Typical(4) Limits(5) (2) t1 I2C Clock Period 2.5 µs (min) t2 I2C Data Setup Time 250 ns (min) t3 I2C Data Stable Time 0 ns (min) t4 Start Condition Time 250 ns (min) t5 Stop Condition Time 250 ns (min) t6 I2C Data Hold Time 250 ns (min) fSPI Maximum SPI Frequency 250 kHz (max) tEL SPI ENB High Time 250 ns (min) tDS SPI Data Setup Time 250 ns (min) tES SPI ENB Setup Time 250 ns (min) tDH SPI Data Hold Time 250 ns (min) tEH SPI Enable Hold Time 250 ns (min) tCL SPI Clock Low Time 500 ns (min) tCH SPI Clock High Time 500 ns (min) 0.7xI2CSPI VIH I2C/SPI Input Voltage High V (min) VDD 0.25 xI2CSPI VIL I2C/SPI Input Voltage Low V (max) VDD (1) Operating Ratings indicate conditions for which the device is functional, but do not ensure specific performance limits. For ensured specifications and test conditions, see the Electrical Characteristics. The ensured specifications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed test conditions. (2) All voltages are measured with respect to the ground pin, unless otherwise specified. (3) Datasheet min/max specifications are specified by design, test, or statistical analysis. (4) Typical specifications are specified at +25°C and represent the most likely parametric norm. (5) Tested limits are specified to TI's AOQL (Average Outgoing Quality Level). 10 Submit Documentation Feedback Copyright © 2006–2007, Texas Instruments Incorporated Product Folder Links: LM4946 |
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