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MC100EPT21MNR4G 데이터시트(PDF) 4 Page - ON Semiconductor

부품명 MC100EPT21MNR4G
상세설명  3.3V Differential LVPECL/LVDS/CML to LVTTL/LVCMOS Translator
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제조업체  ONSEMI [ON Semiconductor]
홈페이지  http://www.onsemi.com
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MC100EPT21
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Table 5. LVTTL/LVCMOS OUTPUT DC CHARACTERISTICS VCC = 3.3 V, GND = 0.0 V, TA = −40°C to 85°C
Symbol
Characteristic
Condition
Min
Typ
Max
Unit
VOH
Output HIGH Voltage
IOH = −3.0 mA
2.4
V
VOL
Output LOW Voltage
IOL = 24 mA
0.5
V
ICCH
Power Supply Current
Outputs set to HIGH
5
17
25
mA
ICCL
Power Supply Current
Outputs set to LOW
8
21
30
mA
IOS
Output Short Circuit Current
−130
−80
mA
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared
operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit
values are applied individually under normal operating conditions and not valid simultaneously.
Table 6. AC CHARACTERISTICS VCC = 3.0 V to 3.6 V, GND = 0.0 V (Note 5)
Symbol
Characteristic
−40°C
25°C
85°C
Unit
Min
Typ
Max
Min
Typ
Max
Min
Typ
Max
fmax
Maximum Frequency
(Figure 2)
275
350
275
350
275
350
MHz
tPLH,
tPHL
Propagation Delay to
Output Differential
800
1200
1400
1400
2050
1800
800
1200
1400
1400
2250
1800
900
1100
1600
1300
2950
1900
ps
tSKEW
Duty Cycle Skew (Note 6)
45
50
55
45
50
55
45
50
55
%
tSKPP
Part−to−Part Skew (Note 6)
500
500
500
ps
tJITTER
Random Clock Jitter (RMS)
3.5
5
3.5
5
3.5
5
ps
VPP
Input Voltage Swing
(Differential Configuration)
150
800
1200
150
800
1200
150
800
1200
mV
tr
tf
Output Rise/Fall Times
(0.8V − 2.0V)
Q, Q
250
600
900
250
600
900
250
600
900
ps
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared
operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit
values are applied individually under normal operating conditions and not valid simultaneously.
5. Measured with a 750 mV 50% duty−cycle clock source. RL = 500 W to GND and CL = 20 pF to GND. Refer to FIgure 3.
6. Skews are measured between outputs under identical transitions. Duty cycle skew is measured between differential outputs using the
deviations of the sum Tpw− and Tpw+.


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