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CDCM61004RHBT 데이터시트(PDF) 9 Page - Texas Instruments |
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CDCM61004RHBT 데이터시트(HTML) 9 Page - Texas Instruments |
9 / 39 page CDCM61004 www.ti.com SCAS871H – FEBRUARY 2009 – REVISED JANUARY 2016 7.5 Electrical Characteristics At VCC = 3 V to 3.6 V and TA = –40°C to 85°C, unless otherwise noted. PARAMETER TEST CONDITIONS MIN TYP MAX UNIT CONTROL PIN LVCMOS INPUT CHARACTERISTICS VIH Input high voltage 0.6 VCC V VIL Input low voltage 0.4 VCC V IIH Input high current VCC = 3.6 V, VIL = 0 V 200 μA IIL Input low current VCC = 3 V, VIH = 3.6 V –200 μA LVCMOS OUTPUT CHARACTERISTICS(1) (See Figure 7 and Figure 8) fOSC_OUT Bypass output frequency 21.875 28.47 MHz fOUT Output frequency 43.75 250 MHz VOH Output high voltage VCC = min to max, IOH = –100 μA VCC –0.5 V VOL Output low voltage VCC = min to max, IOL = 100 μA 0.3 V tRJIT RMS phase jitter 250 MHz (10 kHz to 20 MHz) 0.85 ps, RMS tSLEW-RATE Output rise/fall slew rate 20% to 80% 2.4 V/ns ODC Output duty cycle 45% 55% tSKEW Skew between outputs 60 ps ICC, Device current, LVCMOS fIN = 25 MHz, fOUT = 250 MHz, CL = 5 pF 175 205 mA LVCMOS LVPECL OUTPUT CHARACTERISTICS(2) (See Figure 9 and Figure 10) fOUT Output frequency 43.75 683.264 MHz VOH Output high voltage VCC –1.18 VCC –0.73 V VOL Output low voltage VCC –2 VCC –1.55 V |VOD| Differential output voltage 0.6 1.23 V tRJIT RMS phase jitter 625 MHz (10 kHz to 20 MHz) 0.77 ps, RMS tR/tF Output rise/fall time 20% to 80% 175 ps ODC Output duty cycle 45% 55% tSKEW Skew between outputs 30 ps ICC, Device current, LVPECL fIN = 25 MHz, fOUT = 625 MHz 180 215 mA LVPECL LVDS OUTPUT CHARACTERISTICS(3) (See Figure 11 and Figure 12) fOUT Output frequency 43.75 683.264 MHz |VOD| Differential output voltage 0.247 0.454 V ΔVOD VDD magnitude change 50 mV VOS Common-mode voltage 1.125 1.375 V ΔVOS VOS magnitude change 50 mV tRJIT RMS phase jitter 625 MHz (10 kHz to 20 MHz) 0.73 ps, RMS tR/tF Output rise/fall time 20% to 80% 255 ps ODC Output duty cycle 45% 55% tSKEW Skew between outputs 40 ps ICC, LVDS Device current, LVDS fIN = 25 MHz, fOUT = 625 MHz 150 195 mA (1) Figure 7 and Figure 8 show DC and AC test setups, respectively. Jitter measurements made using 25-MHz quartz crystal inches. (2) Figure 9 and Figure 10 show DC and AC test setups, respectively. Jitter measurements made using 25-MHz quartz crystal inches. (3) Figure 11 and Figure 12 show DC and AC test setups, respectively. Jitter measurements made using 25-MHz quartz crystal inches. Copyright © 2009–2016, Texas Instruments Incorporated Submit Documentation Feedback 9 Product Folder Links: CDCM61004 |
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