®

DAC7528

4

ELECTROSTATIC

DISCHARGE SENSITIVITY

Any integrated circuit can be damaged by ESD. Burr-Brown

recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling

and installation procedures can cause damage.

ESD damage can range from subtle performance degrada-

tion to complete device failure. Precision integrated circuits

may be more susceptible to damage because very small

parametric changes could cause the device not to meet

published specifications.

ABSOLUTE MAXIMUM RATINGS

Operating Temperature Range U,P ................................ –40

°C to +85°C

DICE ............................... 0

°C to +70°C

Junction Temperature .................................................................. +150

°C

Storage Temperature ..................................................... –60

°C to +150°C

Lead Temperature (soldering, 10s) ............................................. +300

°C

θ

JA

U package ........................................................................ 105

°C/W

P package ........................................................................... 85

°C/W

θ

P package .......................................................................... 35

°C/W

NOTES:

θ

specified for device in socket for PDIP package.

3 and 19). (2) The digital control inputs are zener-protected: however,

permanent damage may occur on unprotected units from high-energy

electrostatic fields. Keep units in conductive foam at all times until ready

to use.

(3) Use proper antistatic handling procedures. (4) Absolute

Maximum Ratings apply to both packaged devices and DICE. Stresses

above those listed under Absolute Maximum Ratings may cause perma-

nent damage to the device.

TYPICAL PERFORMANCE CURVES

WRITE CYCLE TIMING DIAGRAM

t

DS

V

IH

V

IL

Data

In Stable

V

DD

0

t

WR

t

AS

t

AH

V

DD

0

V

DD

0

Data In

(DB0-DB7)

WR

DAC A/DAC B

t

CS

t

CH

V

DD

0

CS

t

DH

NOTE: All input signal rise and fall times are measured from 10% to 90%

Digital Inputs: All digital inputs of the DAC7528 incorpo-

rate on-chip ESD protection circuitry. This protection is

designed and has been tested to withstand five 2500V

positive and negative discharges (100pF in series with 1500

Ω)

applied to each digital input.

Analog Pins: Each analog pin has been tested to Burr-

Brown's analog ESD test consisting of five 1000V positive

and negative discharges (100pF in series with 1500

Ω) ap-

plied to each pin. R

some sensitivity.

MODE SELECTION TABLE

DAC A/DAC B

CS

WR

DAC A

DAC B

L

L

L

WRITE

HOLD

H

L

L

HOLD

WRITE

X

H

X

HOLD

HOLD

X

X

H

HOLD

HOLD

SUPPLY CURRENT vs DIGITAL INPUT VOLTAGE

0

1.0

2.0

3.0

4.0

7.0

6.0

5.0

4.0

3.0

2.0

1.0

0

V

V

5

DAC7528 GAIN TC

4

3

2

1

0

–1

–2

–3

–4

–5

–40

–20

0

20

40

60

80

100

Temperature (°C)