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AD8662ARMZ 데이터시트(PDF) 4 Page - Analog Devices |
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AD8662ARMZ 데이터시트(HTML) 4 Page - Analog Devices |
4 / 5 page Preliminary Technical Data AD8661/AD8662/AD8664 - 4- Rev PrA 10/5/04 ABSOLUTE MAXIMUM RATINGS1 Supply voltage.........................................................................+18V Input Voltage ....................................................................Gnd to Vs Differential Input Voltage .......................................................±18V Output Short-Circuit Duration to Gnd2.....Observe Derating Curves Storage Temperature Range R, CP, RM, RU Package................................-65°C to +150°C Operating Temperature Range AD8661/AD8662/AD8664 ............................-40°C to +125°C Junction Temperature Range R, CP, RM, RU Package................................-65°C to +150°C Lead Temperature Range (Soldering, 60 Sec) ............. +300°C Package Type θJA θJC Units 8-Pin LFCSP (CP) -- °C/W 8-Pin microSOIC (RM) 210 45 °C/W 8-Pin SOIC (R) 158 43 °C/W 14-Pin SOIC (R) 120 36 °C/W 14-Pin TSSOP (RU) 180 35 °C/W NOTES 1 Absolute maximum ratings apply at 25°C, unless otherwise noted. 2 θJA is specified for the worst-case conditions, i.e., θJAis specified for device soldered in circuit board for surface mount packages. ORDERING GUIDE Model Temperature Range Package Description Package Option Branding Information AD8661ACP -40°C to +125°C 8-Pin LFCSP CP-8 AD8661ARZ -40°C to +125°C 8-Pin SOIC R-8 AD8662ARMZ -40°C to +125°C 8-Pin micro-SOIC RM-8 AD8662ARZ -40°C to +125°C 8-Pin SOIC R-8 AD8664ARZ -40°C to +125°C 14-Pin SOIC R-14 AD8664ARUZ -40°C to +125°C 14-Pin TSSOP RU-14 CAUTION ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 1500 V readily accumulate on the human body and test equipment and can discharge without detection. Although this device features proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high-energy electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality. |
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