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TC58DVM82F1FT00 데이터시트(PDF) 21 Page - Toshiba Semiconductor

부품명 TC58DVM82F1FT00
상세설명  128-MBIT (16M x 8 BITS/8M x 16BITS) CMOS NAND E2PROM
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제조업체  TOSHIBA [Toshiba Semiconductor]
홈페이지  http://www.semicon.toshiba.co.jp/eng
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TC58DVM72A1FT00/ TC58DVM72F1FT00
TC58DAM72A1FT00/ TC58DAM72F1FT00
2003-01-24
21/34
Status Read
The device automatically implements the execution and verification of the Program and Erase operations. The
Status Read function is used to monitor the Ready/Busy status of the device, determine the result (pass/fail) of a
Program or Erase operation, and determine whether the device is in Protect mode. The device status is output
via the I/O port on the RE clock after a 70H command input. The resulting information is outlined in Table 5.
Table 5. Status output table
STATUS
OUTPUT
I/O1
Pass/Fail
Pass: 0
Fail: 1
I/O2
Not Used
0
I/O3
Not Used
0
I/O4
Not Used
0
I/O5
Not Used
0
I/O6
Not Used
0
I/O7
Ready/Busy
Ready: 1
Busy: 0
I/O8
Write Protect
Protect: 0
Not Protected: 1
I/O9 to I/O16
Not Used
0
The Pass/Fail status on I/O1 is only
valid when the device is in the Ready
state.
An application example with multiple devices is shown in Figure 6.
System Design Note: If the
BY
/
RY
pin signals from multiple devices are wired together as shown in the
diagram, the Status Read function can be used to determine the status of each individual device.
Device
1
CLE
1
CE
Device
2
2
CE
Device
3
3
CE
Device
N
N
CE
Device
N
1
1
N
CE
ALE
WE
RE
I/O1
~I/O8
BY
/
RY
WE
RE
Status on
Device 1
70H
1
CE
ALE
I/O
70H
Status on
Device N
CLE
N
CE
Figure 6. Status Read timing application example
Busy
BY
/
RY


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