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TLV2217 데이터시트(HTML) 3 Page - Texas Instruments

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부품명 TLV2217
상세내용  LOW DROPOUT FIXED VOLTAGE REGULATORS
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제조사  TI [Texas Instruments]
홈페이지  http://www.ti.com
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TLV2217 데이터시트(HTML) 3 Page - Texas Instruments

 
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TLV2217
LOW DROPOUT FIXEDVOLTAGE REGULATORS
SLVS067K − MARCH 1992 − REVISED AUGUST 2004
3
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
electrical characteristics at VI = 4.5 V, IO = 500 mA, TJ = 25°C (unless otherwise noted)
PARAMETER
TEST CONDITIONS†
TLV2217-33
UNIT
PARAMETER
TEST CONDITIONS†
MIN
TYP
MAX
UNIT
Output voltage
IO = 20 mA to 500 mA,
VI = 3.8 V to 5.5 V
TJ = 25°C
3.267
3.30
3.333
V
Output voltage
IO = 20 mA to 500 mA,
VI = 3.8 V to 5.5 V
TJ = 0°C to 125°C
3.234
3.366
V
Input voltage regulation
VI = 3.8 V to 5.5 V
5
15
mV
Ripple rejection
f = 120 Hz,
Vripple = 1 VPP
VI = 4.5 V
−62
dB
Output voltage regulation
IO = 20 mA to 500 mA
5
30
mV
Output noise voltage
f = 10 Hz to 100 kHz
500
µV
Dropout voltage
IO = 250 mA
400
mV
Dropout voltage
IO = 500 mA
500
mV
Bias current
IO = 0
2
5
mA
Bias current
IO = 500 mA
19
49
mA
† Pulse-testing techniques are used to maintain the virtual junction temperature as close to the ambient temperature as possible. Thermal effects
must be taken into account separately. All characteristics are measured with a 0.1-
µF capacitor across the input and a 22-µF tantalum capacitor,
with equivalent series resistance of 1.5
Ω, on the output.
electrical characteristics at VI = 3.3 V, IO = 500 mA, TJ = 25°C (unless otherwise noted)
PARAMETER
TEST CONDITIONS†
TLV2217-25
UNIT
PARAMETER
TEST CONDITIONS†
MIN
TYP
MAX
UNIT
Output voltage
IO = 20 mA to 500 mA,
VI = 3.0 V to 5.5 V
TJ = 25°C
2.475
2.5
2.525
V
Output voltage
IO = 20 mA to 500 mA,
VI = 3.0 V to 5.5 V
TJ = 0°C to 125°C
2.45
2.55
V
Input voltage regulation
VI = 3.0 V to 5.5 V
4
12
mV
Ripple rejection
f = 120 Hz,
Vripple = 1 VPP,
VI = 4.5 V
−62
dB
Output voltage regulation
IO = 20 mA to 500 mA
4
23
mV
Output noise voltage
f = 10 Hz to 100 kHz
500
µV
Dropout voltage
IO = 250 mA
400
mV
Dropout voltage
IO = 500 mA
500
mV
Bias current
IO = 0
2
5
mA
Bias current
IO = 500 mA
19
49
mA
† Pulse-testing techniques are used to maintain the virtual junction temperature as close to the ambient temperature as possible. Thermal effects
must be taken into account separately. All characteristics are measured with a 0.1-
µF capacitor across the input and a 22-µF tantalum capacitor,
with equivalent series resistance of 1.5
Ω, on the output.


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