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AD5247BKS100-RL7 데이터시트(PDF) 11 Page - Analog Devices |
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AD5247BKS100-RL7 데이터시트(HTML) 11 Page - Analog Devices |
11 / 20 page AD5247 TEST CIRCUITS Figure 25 to Figure 30 define the test conditions used in the product Specification tables. VMS A W B DUT V+ V+ = VDD 1LSB = V+/2N Figure 25. Test Circuit for Potentiometer Divider Nonlinearity Error (INL, DNL) NO CONNECT IW VMS A W B DUT Figure 26. Test Circuit for Resistor Position Nonlinearity Error (Rheostat Operation; R-INL, R-DNL) VMS1 IW = VDD/RNOMINAL VMS2 VW RW = [VMS1 – VMS2]/IW A W B DUT Figure 27. Test Circuit for Wiper Resistance ∆VMS% DD% PSS (%/%) = V+= VDD 10% PSRR (dB) = 20 LOG DUT MS DD ( ) VDD VA VMS A W B V+ ∆V ∆V ∆V Figure 28. Test Circuit for Power Supply Sensitivity (PSS, PSSR) W A B +15V DUT –15V VOUT OP27 VIN Figure 29. Test Circuit for Gain vs. Frequency VDD A W B GND ICM VCM NC DUT NC Figure 30. Test Circuit for Common-Mode Leakage Current Rev. 0 | Page 11 of 20 |
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