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INA253 데이터시트(Datasheet) 8 Page - Texas Instruments

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부품명 INA253
상세내용  High Voltage, Bidirectional, Zero-Drift, Current-Shunt Monitor with Integrated 2-mΩ Precision Low Inductive Shunt Resistor
PDF  24 Pages
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제조사  TI1 [Texas Instruments]
홈페이지  http://www.ti.com
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 8 page
background image
0
20
40
60
80
100
0.1
1
10
100
Time (s)
C027
5
7.5
10
12.5
15
17.5
20
±50
±25
0
25
50
75
100
125
150
Temperature (
ƒC)
C026
8
INA253
SLOS954 – MAY 2018
www.ti.com
Product Folder Links: INA253
Submit Documentation Feedback
Copyright © 2018, Texas Instruments Incorporated
Feature Description (continued)
External factors (such as ambient temperature, external air flow, and PCB layout) can contribute to how
effectively the heat developed as a result of the current flowing through the total package resistance can be
removed from within the device. Under the conditions of no air flow, a maximum ambient temperature of 85°C,
and 1-oz. copper input power planes, the INA253 can accommodate continuous current levels up to 15 A. As
shown in Figure 1, the current handling capability is derated at temperatures above the 85°C level with safe
operation up to 10 A at a 125°C ambient temperature. With air flow and larger 2-oz. copper input power planes,
the INA253 can safely accommodate continuous current levels up to 15 A over the entire –40°C to 125°C
temperature range.
Figure 1. Maximum Continuous Current vs Temperature
8.3.2 Short-Circuit Duration
The INA253 features a physical shunt resistance that is able to withstand current levels higher than the
continuous handling limit of 15 A without sustaining damage to the current-sensing resistor or the current-sensing
amplifier if the excursions are brief. Figure 2 shows the short-circuit duration curve for the INA253.
Figure 2. Short-Circuit Duration
8.3.3 Temperature Stability
System calibration is common for many industrial applications to eliminate initial component and system-level
errors that can be present. A system-level calibration can reduce the initial accuracy requirement for many of the
individual components because the errors associated with these components are effectively eliminated through
the calibration procedure.
Performing this calibration enables precision measurements at the temperature in
which the system is calibrated. As the system temperature changes as a result of external ambient changes or
due to self heating, measurement errors are reintroduced. Without accurate temperature compensation used in




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