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S71PL129JC0 ๋ฐ์ดํ„ฐ์‹œํŠธ(HTML) 66 Page - SPANSION

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์ƒ์„ธ๋‚ด์šฉ  Stacked Multi-Chip Product (MCP) Flash Memory
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S29PL129J for MCP
S29PL129J_MCP_00_A0 June 4, 2004
Advance
Info rmation
VCC RampRate
All DC characteristics are specified for a VCC ramp rate > 1V/100 ยตs and VCC
>=VCCQ - 100 mV. If the VCC ramp rate is < 1V/100 ยตs, a hardware reset
required.+
Read Operations
Notes:
1. Not 100% tested.
2. See Figure 9 and Table 16 for test specifications
3. Measurements performed by placing a 50 ohm termination on the data pin with a bias of VCC /2. The time from OE#
high to the data bus driven to VCC /2 is taken as tDF.
4. S29PL129J has two CE# (CE1#, CE2#).
5. Valid CE1# / CE2# conditions: (CE1# = VIL,CE2# = VIH) or (CE1# = VIH,CE2# = VIL) or (CE1# = VIH, CE2# = VIH)
6. Valid CE1# / CE2# transitions: (CE1# = VIL,CE2# = VIH) or (CE1# = VIH,CE2# = VIL) to (CE1# = CE2# = VIH)
7. Valid CE1# / CE2# transitions: (CE1# = CE2# = VIH) to (CE1# = VIL,CE2# = VIH) or (CE1# = VIH,CE2# = VIL)
8. For 70pF Output Load Capacitance, 2 ns is added to the above tACC,tCE,tPACC,tOE values for all speed grades
Figure 10. Input Waveforms and Measurement Levels
Table 18. Read-Only Operations
Parameter
Description
Test Setup
Speed Options
JEDEC
Std.
55
60
65
70
Unit
tAVAV
tRC Read Cycle Time (Note 1)
Min
55
60
65
70
ns
tAVQV
tACC Address to Output Delay
CE#, OE# = VIL
Max
55
60
65
70
ns
tELQV
tCE
Chip Enable to Output Delay
OE# = VIL
Max
55
60
65
70
ns
tPACC Page Access Time
Max
20
25
25
30
ns
tGLQV
tOE Output Enable to Output Delay
Max
20
25
30
ns
tEHQZ
tDF
Chip Enable to Output High Z (Note 3)
Max
16
ns
tGHQZ
tDF
Output Enable to Output High Z
(Notes 1, 3)
Max
16
ns
tAXQX
tOH
Output Hold Time From Addresses, CE# or
OE#, Whichever Occurs First (Note 3)
Min
5
ns
tOEH
Output Enable Hold
Time (Note 1)
Read
Min
0
ns
Toggle and
Data# Polling
Min
10
ns
VIO
0.0 V
VIO/2
VIO/2
Output
Measurement Level
In


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