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SMP100LC-140 데이터시트(PDF) 8 Page - STMicroelectronics |
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SMP100LC-140 데이터시트(HTML) 8 Page - STMicroelectronics |
8 / 10 page SMP100LC 8/10 Figure 13: Ordering Information Scheme Figure 12: Test circuit 3 for dynamic IH parameter TEST PROCEDURE 1/ Adjust the current level at the I value by short circuiting the AK of the D.U.T. 2/ Fire the D.U.T. with a surge current H ➔ I= 10A, 10/1000µs. 3/ The D.U.T. will come back off-state within 50ms maximum. PP This is a GO-NOGO test which allows to confirm the holding current (I ) level in a functional test circuit. H R VBAT =-48 V Surge generator D.U.T SMP 100 LC - xxx Trisil Surface Mount Repetitive Peak Pulse Current Capacitance Voltage 100 = 100A LC = Low Capacitance 65 = 65V |
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