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GRM1885C2A5R0WA01 ๋ฐ์ดํ„ฐ์‹œํŠธ(HTML) 4 Page - Murata Manufacturing Co., Ltd

๋ถ€ํ’ˆ๋ช… GRM1885C2A5R0WA01
์ƒ์„ธ๋‚ด์šฉ  Chip Multilayer Ceramic Capacitors for General Purpose
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GRM1885C2A5R0WA01 ๋ฐ์ดํ„ฐ์‹œํŠธ(HTML) 4 Page - Murata Manufacturing Co., Ltd

 
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No.
15 High
Appearance
No defects or abnormalities.
Solder the capacitor on the test substrate shown in Fig.3.
Temperature
Test Temperature :
40+/-2โ„ƒ
High Humidity
Capacitance Within +/-7.5% or +/-0.75pF (Whichever is larger)
Test Humidity :
90%RH to 95%RH
(Steady)
Change
Test Time :
500+/-12h
Q or D.F.
Qโ‰ง100+10C/3 C:Nominal Capacitance(pF)
Test Voltage :
Rated Voltage
Charge/Discharge Current : 50mA max.
I.R.
More than 500Mฮฉ or 25ฮฉ๏ฝฅF (Whichever is smaller)
Post-treatment :
Let sit for 24+/-2hours at room temperature, then measure.
16 Durability
Appearance
No defects or abnormalities.
Solder the capacitor on the test substrate shown in Fig.3.
Test Temperature :
Maximum Operating Temperature+/-3โ„ƒ
Capacitance Within +/-3% or +/-0.3pF (Whichever is larger)
Test Time :
1000+/-12h
Change
Test Voltage :
200% of the rated voltage
Q or D.F.
Qโ‰ง200+10C C:Nominal Capacitance(pF)
Charge/Discharge Current : 50mA max.
I.R.
More than 1000Mฮฉ or 50ฮฉ๏ฝฅF (Whichever is smaller)
Post-treatment :
Let sit for 24+/-2hours at room temperature, then measure.
Item
Specification
Test Method (Ref. Standard:JIS C 5101, IEC60384)
Step
Temperature(โ„ƒ)
Time (min)
1
Min.Operating Temp. +0/-3
30+/-3
2
Reference Temp.
2 to 3
3
Max.Operating Temp. +3/-0
30+/-3
4
Reference Temp.
2 to 3
Table A Capacitance Change between at Reference Temp. and at each Temp. (%)
Char.
5C
0.58
-0.24
0.4
-0.17
0.25
Max.
Min.
Max.
Min.
Max.
-0.11
Min.
-55โ„ƒ
-30โ„ƒ
-10โ„ƒ
Step
Temperature(ยฐC)
Applying Voltage
1
Reference Temp. +/-2
2
Min. Operating Temp. +/-3
3
*
Reference Temp. +/-2
4
Max. Operating Temp. ยฑ3
5
Reference Temp. +/-2
No bias
GRM1885C2A5R0WA01-01A


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