전자부품 데이터시트 검색엔진 |
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ISL43L840IR 데이터시트(PDF) 5 Page - Intersil Corporation |
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ISL43L840IR 데이터시트(HTML) 5 Page - Intersil Corporation |
5 / 11 page 5 FN6096.1 Test Circuits and Waveforms Logic input waveform is inverted for switches that have the opposite logic sense. FIGURE 1A. ADDRESS tTRANS MEASUREMENT POINTS Repeat test for other switches. CL includes fixture and stray capacitance. FIGURE 1B. ADDRESS tTRANS TEST CIRCUIT FIGURE 1. SWITCHING TIMES FIGURE 2A. Q MEASUREMENT POINTS FIGURE 2B. Q TEST CIRCUIT FIGURE 2. CHARGE INJECTION FIGURE 3A. tBBM MEASUREMENT POINTS Repeat test for other switches. CL includes fixture and stray capacitance. FIGURE 3B. tBBM TEST CIRCUIT FIGURE 3. BREAK-BEFORE-MAKE TIME 50% tr < 5ns tf < 5ns tTRANS 90% V+ 0V 0V tTRANS LOGIC INPUT SWITCH OUTPUT 10% VOUT 0V VA0, VB0 VOUT V(NO or NC) RL RL R ON () + ------------------------------ = LOGIC INPUT VOUT RL COMA A0,B0 ADD1-0 50 Ω 35pF GND A1-A3 CL V+ C V+ C COMB B1-B3 VOUT ∆V OUT OFF ON OFF Q = ∆VOUT x CL SWITCH OUTPUT LOGIC INPUT V+ 0V CL VOUT RG VG GND COMA Ax, Bx LOGIC INPUT ADDX V+ C Repeat test for other switches. 1nF 0 Ω COMB 90% V+ 0V tBBM LOGIC INPUT SWITCH OUTPUT 0V VOUT tr < 5ns tf < 5ns LOGIC INPUT ADD1-0 COMA RL CL VOUT 35pF 50 Ω A0-A3 GND V+ C V+ C B0-B3 COMB ISL43L840 |
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