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MSP430FG4619 ๋ฐ์ดํ„ฐ์‹œํŠธ(HTML) 42 Page - Texas Instruments

๋ถ€ํ’ˆ๋ช… MSP430FG4619
์ƒ์„ธ๋‚ด์šฉ  MSP430FG461x, MSP430CG461x Mixed-Signal Microcontrollers
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MSP430FG4619 ๋ฐ์ดํ„ฐ์‹œํŠธ(HTML) 42 Page - Texas Instruments

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Conversion1
Conversion2
V OUT
Conversion3
10%
tSRLH
tSRHL
90%
10%
90%
RLoad
AVCC
CLoad =100pF
2
DACOutput
RO/P(DAC12.x)
ILoad
Conversion1
Conversion2
VOUT
Conversion3
Glitch
Energy
+/-1/2LSB
+/-1/2LSB
tsettleLH
tsettleHL
=3k W
42
MSP430FG4619, MSP430FG4618, MSP430FG4617, MSP430FG4616
MSP430CG4619, MSP430CG4618, MSP430CG4617, MSP430CG4616
SLAS508K โ€“ APRIL 2006 โ€“ REVISED MAY 2020
www.ti.com
Submit Documentation Feedback
Product Folder Links: MSP430FG4619 MSP430FG4618 MSP430FG4617 MSP430FG4616 MSP430CG4619
MSP430CG4618 MSP430CG4617 MSP430CG4616
Specifications
Copyright ยฉ 2006โ€“2020, Texas Instruments Incorporated
(1)
RLoad and CLoad connected to AVSS (not AVCC/2) in Figure 5-30.
(2)
Slew rate applies to output voltage steps
โ‰ฅ 200 mV.
5.37
12-Bit DAC, Dynamic Specifications
Vref = VCC, DAC12IR = 1, over recommended ranges of supply voltage and operating free-air temperature (unless otherwise
noted) (see Figure 5-30 and Figure 5-31)
PARAMETER
TEST CONDITIONS
VCC
MIN
TYP MAX
UNIT
tON
DAC12 on time
DAC12_xDAT = 800h,
ErrorV(O) < ยฑ0.5 LSB
(1)
(see Figure 5-30)
DAC12AMPx = 0
โ†’ {2, 3, 4}
2.2 V, 3 V
60
120
ยตs
DAC12AMPx = 0
โ†’ {5, 6}
15
30
DAC12AMPx = 0
โ†’ 7
6
12
tS(FS)
Settling time, full scale
DAC12_xDAT =
80h
โ†’F7Fhโ†’80h
DAC12AMPx = 2
2.2 V, 3 V
100
200
ยตs
DAC12AMPx = 3,5
40
80
DAC12AMPx = 4, 6, 7
15
30
tS(Cโ€“C)
Settling time, code to code
DAC12_xDAT =
3F8h
โ†’408hโ†’3F8h
BF8h
โ†’C08hโ†’BF8h
DAC12AMPx = 2
2.2 V, 3 V
5
ยตs
DAC12AMPx = 3,5
2
DAC12AMPx = 4, 6, 7
1
SR
Slew rate
DAC12_xDAT =
80h
โ†’F7Fhโ†’80h(2)
DAC12AMPx = 2
2.2 V, 3 V
0.05
0.12
V/ยตs
DAC12AMPx = 3,5
0.35
0.7
DAC12AMPx = 4, 6, 7
1.5
2.7
Glitch energy, full-scale
DAC12_xDAT =
80h
โ†’F7Fhโ†’80h
DAC12AMPx = 2
2.2 V, 3 V
600
nV-s
DAC12AMPx = 3,5
150
DAC12AMPx = 4, 6, 7
30
Figure 5-30. Settling Time and Glitch Energy Testing
Figure 5-31. Slew Rate Testing


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