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SN74ALS520 데이터시트(PDF) 1 Page - Texas Instruments |
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SN74ALS520 데이터시트(HTML) 1 Page - Texas Instruments |
1 / 9 page SN54ALS520, SN74ALS518, SN74ALS520, SN74ALS521 8-BIT IDENTITY COMPARATORS SDAS224B – JUNE 1982 – REVISED NOVEMBER 1995 Copyright © 1995, Texas Instruments Incorporated 1 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 • Compare Two 8-Bit Words • Choice of Totem-Pole or Open-Collector Outputs • SN74ALS518 and ′ALS520 Have 20-kΩ Pullup Resistors on Q Inputs • Package Options Include Plastic Small-Outline (DW) Packages, Ceramic Chip Carriers (FK), and Standard Plastic (N) and Ceramic (J) 300-mil DIPs TYPE INPUT PULLUP OUTPUT FUNCTION AND TYPE PULLUP RESISTOR AND CONFIGURATION SN74ALS518 Yes P = Q open collector ′ALS520 Yes P = Q totem pole SN74ALS521‡ No P = Q totem pole ‡ SN74ALS521 is identical to ′ALS688. description These identity comparators perform comparisons on two 8-bit binary or BCD words. The SN74ALS518 provides P = Q outputs, while the ′ALS520 and SN74ALS521 provide P = Q outputs. The SN74ALS518 has an open-collector output. The SN74ALS518 and ′ALS520 feature 20-k Ω pullup resistors on the Q inputs for analog or switch data. The SN54ALS520 is characterized for operation over the full military temperature range of – 55 °C to 125 °C. The SN74ALS518, SN74ALS520, and SN74ALS521 are characterized for operation from 0 °C to 70°C. FUNCTION TABLE INPUTS OUTPUTS DATA P, Q ENABLE G P = Q P = Q P = Q L H L P > Q LL H P < Q LL H X H L H 1 2 3 4 5 6 7 8 9 10 20 19 18 17 16 15 14 13 12 11 G P0 Q0 P1 Q1 P2 Q2 P3 Q3 GND VCC P = Q / P = Q† Q7 P7 Q6 P6 Q5 P5 Q4 P4 SN54ALS520 ...J PACKAGE SN74ALS518, SN74ALS520, SN74ALS521 ... DW OR N PACKAGE (TOP VIEW) 32 1 20 19 910 11 12 13 4 5 6 7 8 18 17 16 15 14 Q7 P7 Q6 P6 Q5 P1 Q1 P2 Q2 P3 SN54ALS520 . . . FK PACKAGE (TOP VIEW) † P = Q for SN74ALS518 P = Q for ′ALS520 and SN74ALS521 PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. |
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