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DS42587 데이터시트(PDF) 36 Page - Advanced Micro Devices |
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DS42587 데이터시트(HTML) 36 Page - Advanced Micro Devices |
36 / 58 page 36 DS42587 TEST CONDITIONS Table 14. Test Specifications KEY TO SWITCHING WAVEFORMS Note: Diodes are IN3064 or equivalent Figure 11. Test Setup 2.7 k Ω CL 6.2 k Ω 3.3 V Device Under Test Test Condition 85 ns Unit Output Load 1 TTL gate Output Load Capacitance, CL (including jig capacitance) 30 pF Input Rise and Fall Times 5 ns Input Pulse Levels 0.0–3.0 V Input timing measurement reference levels 1.5 V Output timing measurement reference levels 1.5 V KS000010-PAL WAVEFORM INPUTS OUTPUTS Steady Changing from H to L Changing from L to H Don’t Care, Any Change Permitted Changing, State Unknown Does Not Apply Center Line is High Impedance State (High Z) 3.0 V 0.0 V 1.5 V 1.5 V Output Measurement Level Input Figure 12. Input Waveforms and Measurement Levels |
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