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DS42587 데이터시트(PDF) 53 Page - Advanced Micro Devices |
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DS42587 데이터시트(HTML) 53 Page - Advanced Micro Devices |
53 / 58 page DS42587 53 AC CHARACTERISTICS Notes: 1. CE1#s controlled, if CIOs is low, ignore UB#s and LB#s timing. 2. t CW is measured from CE1#s going low to the end of write. 3. t WR is measured from the end of write to the address change. tWR applied in case a write ends as CE1#s or WE# going high. 4. tAS is measured from the address valid to the beginning of write. 5. A write occurs during the overlap (t WP) of low CE#1 and low WE#. A write begins when CE1#s goes low and WE# goes low when asserting UB#s or LB#s for a single byte operation or simultaneously asserting UB#s and LB#s for a double byte operation. A write ends at the earliest transition when CE1#s goes high and WE# goes high. The t WP is measured from the beginning of write to the end of write. Figure 31. SRAM Write Cycle—CE1#s Control Address Data Valid UB#s, LB#s WE# Data In Data Out High-Z High-Z tWC CE1#s CE2s tAW tAS (See Note 2 ) tBW tCW (See Note 3) tWR (See Note 4) tWP (See Note 5) tDW tDH |
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