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PESD1563U250 데이터시트(PDF) 2 Page - Shanghai Leiditech Electronic Technology Co., Ltd

부품명 PESD1563U250
부품 상세설명  Varistor voltage In = 1 mA DC
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제조업체  LEIDITECH [Shanghai Leiditech Electronic Technology Co., Ltd]
홈페이지  http://www.leiditech.com
Logo LEIDITECH - Shanghai Leiditech Electronic Technology Co., Ltd

PESD1563U250 데이터시트(HTML) 2 Page - Shanghai Leiditech Electronic Technology Co., Ltd

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1-3 Reliability testing procedures
Reliability
parameter
Test
Test methods and remarks
Test requirement
Pulse current
capability
Imax
8/20
IEC 1051-1, Test 4.5.
10 pulses in the same direction at 2
pulses per minute at maximum peak
current
d
Vn/Vn≤ 10%
no visible damage
Electrostatic
discharge
capability
ESD
C=150 pF,
R=330
IEC 1000-4-2
Each
10
times
in
positive/negative
direction in 10 sec at 8KV contact
discharge (Level 4)
d
Vn/Vn≤ 10%
no visible damage
Environmenta
l reliability
Thermal shock
IEC 68-2-14
Condition for 1 cycle
Step 1 : Min.
–40℃, 30±3 min.
Step 2 : Max. +125
℃, 30±3 min.
Number of cycles: 30 times
d
Vn/Vn≤ 5%
no visible damage
Low temperature
IEC 68-2-1
Place the chip at -40
±5℃ for 1000±
12hrs. Remove and place for 24
±2hrs at
room temp. condition, then measure
d
Vn/Vn≤ 5%
no visible damage
High temperature
IEC 68-2-2
Place the chip at 125
±5℃ for 1000±
24hrs. Remove and place for 24
±2hrs at
room temp. condition, then measure
d
Vn/Vn≤ 5%
no visible damage
Heat resistance
IEC 68-2-3
Apply the rated voltage for 1000
±48hrs at
85
±3℃. Remove and place for 24±2hrs
at room temp. condition, then measure
d
Vn/Vn≤ 5%
no visible damage
Humidity
resistance
IEC 68-2-30
Place the chip at 40
±2℃ and 90 to 95%
humidity for 1000
±24hrs. Remove and
place
for
24
±2hrs at room temp.
condition, then measure
d
Vn/Vn≤ 10%
no visible damage
Pressure cooker
test
Place the chip at 2 atm, 120
℃, 85%RH
for 60 hrs. Remove and place for 24
±
2hrs at room temp. condition, then
measure
d
Vn/Vn≤ 10%
no visible damage
PESD1563U250
Rev :
www.leiditech.com
01.06.2018
2/5


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