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AM79C03JC 데이터시트(PDF) 9 Page - Advanced Micro Devices |
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AM79C03JC 데이터시트(HTML) 9 Page - Advanced Micro Devices |
9 / 48 page SLAC Products 9 ABSOLUTE MAXIMUM RATINGS Storage temperature . . . . . . . . . –60°C ≤ T A ≤ +125°C Ambient operating temperature . . –40°C ≤ T A ≤ +85°C Ambient relative humidity . . . . . . . . . . . . . 5% to 100% (noncondensing) VCCA with respect to AGND . . . . . . . .–0.4 V to +7.0 V VCCD with respect to DGND. . . . . . . .–0.4 V to +7.0 V VCCP with respect to PGND . . . . . . . .–0.4 V to +7.0 V VEE with respect to AGND . . . . . . . . .+0.4 V to –7.0 V VIN with respect to VCCA. . . . . . . . .+0.4 V to –10.0 V (VEE = –5 V) VIN with respect to VEE . . . . . . . . . .–0.4 V to +10.0 V (VCCA = +5 V) Other pins with respect to DGND1 . . . . .–0.4 V to VCC Total combined C1–C5 current per channel: Source from VCC . . . . . . . . . . . . . . . . . . . . . . . 32 mA Sink into DGND . . . . . . . . . . . . . . . . . . . . . . . . 24 mA Latch-up immunity (any pin). . . . . . . . . . . . . . ±30 mA Stresses above those listed under Absolute Maximum Ratings may cause permanent device failure. Functionality at or above these limits is not implied. Exposure to Absolute Maximum Ratings for extended periods may affect device reliability. OPERATING RANGES Commercial (C) Devices Analog supply . . . . . . . . . . . . . . . . . . . . . . +5.0 V ±5% VCCA1, VCCA2, or VCCA Digital supply . . . . . . . . . . . . . . . . . . . . . . +5.0 V ±5% VCCP, VCCD1, VCCD2, or VCCD Analog supply VEE1, VEE2 . . . . . . . . . . . . –5.0 V ±5% PGND, DGND1, DGND2, or DGND . . . . . . . . . . . . 0 V AGND1, AGND2, or AGND . . . . . . . . . . . . . . . ±50 mV Ambient temperature . . . . . . . . . . . 0°C ≤ T A ≤ +70°C* Ambient relative humidity . . . . . . . . . . . . . 15% to 85% Operating Ranges define those limits between which the functionality of the device is guaranteed. * Functionality of the device from 0 °C to +70°C is guaranteed by production testing. Performance from –40 °C to +85°C is guaranteed by characterization and periodic sampling of production units. |
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