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TH58NS100DC 데이터시트(HTML) 41 Page - Toshiba Semiconductor

부품명 TH58NS100DC
상세내용  TOSHIBA MOS DIGITAL INTEGRATED CIRCUIT SILICON GATE CMOS 1 - GBIT (128M X 8 BITS) CMOS NAND E2PROM ( 128M BYTE SmartMediaTM )
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제조사  TOSHIBA [Toshiba Semiconductor]
홈페이지  http://www.semicon.toshiba.co.jp/eng
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TH58NS100DC 데이터시트(HTML) 41 Page - Toshiba Semiconductor

 
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TH58NS100DC
2001-03-21
41/43
(14)
Invalid blocks (bad blocks)
The device contains unusable blocks. Therefore, the following issues must be recognized:
Referring to the Block status area in the redundant area allows the
system to detect bad blocks in the accordance with the physical data
format issued by the SSFDC Forum. Detect the bad blocks by checking the
Block Status Area at the system power-on, and do not access the bad
blocks in the following routine.
The number of valid blocks at the time of shipment is as follows:
MIN
TYP.
MAX
UNIT
Valid (Good) Block Number
8032
¾
8192
Block
(15)
Failure phenomena for Program and Erase operations
The device may fail during a Program or Erase operation.
The following possible failure modes should be considered when implementing a highly reliable system.
FAILURE MODE
DETECTION AND COUNTERMEASURE SEQUENCE
Block
Erase Failure
Status Read after Erase
® Block Replacement
Page
Programming Failure
Status Read after Program
® Block Replacement
(1) Block Verify after Program
® Retry
Single Bit
Programming Failure
1
® 0
(2) ECC
· ECC: Error Correction Code
· Block Replacement
Program
Erase
When an error occurs for an Erase operation, prevent future accesses to this bad block (again by
creating a table within the system or by using another appropriate scheme).
(16)
Chattering of Connector
There may be contact chattering when the device is inserted or removed from a connector.
This chattering may cause damage to the data in the device. Therefore, sufficient time must be allowed for
contact bouncing to subside when a system is designed with SmartMediaTM.
(17)
The device is formatted to comply with the Physical and Logical Data Format of the SSFDC Forum at the
time of shipping.
Bad Block
Bad Block
Figure 26.
When an error happens in Block A, try to
reprogram the data into another (Block B) by
loading from an external buffer. Then, prevent
further system accesses to Block A (by creating
a bad block table or by using an another
appropriate scheme).
Block A
Block B
Error occurs
Buffer
memory
Figure 27.


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