IZ8005

3

Pad Description

Pad

Pad Name

I/O

Function

1~3

SA1~SA3

O

LCD segment drive

4~6

SB1~SB3

O

LCD segment drive

7~19

SC1~SC3

O

LCD segment drive

10~12

SD1~SD3

O

LCD segment drive

13

SE1

O

LCD segment drive

14

VEE

O

Generate negative voltage (–1.5V)

15

CAP

O

For negative voltage, NMOS output

16

C512

O

For negative voltage, inverter output

17

TV

B

Test pin for IC

18

TEST1

I

Test pin for IC

19

LOWC

B

For the supply voltage detector. Open the pin when not in use.

20

VSS

I

Power supply GND

21

SC

B

Common point, NMOS open drain

22

RF

O

Connect reference resistor, PMOS open drain

23

RS

O

Connect sensor resistor, PMOS open drain

24

VDD

I

Positive power supply

25

PSW

I

Pull low input pin, push switch to turn the power on or off

26

TEST2

I

Pull low test pin, for production test, floating LCD displays the real time

value, when connected to VDD, LCD displays the highest value.

27

INIT

I

Test pin for IC

28

ML

I

Connect to VDD for memory function, otherwise floating.

29

FEVL

I

Floating with fever function, otherwise connect to VDD.

30

S804KL

I

Floating buzzer is 4kHz, connect to VDD if buzzer is 8kHz.

31

OSCI

I

For system oscillator in

32

OSCO

O

For system oscillator out

33

BZ1

O

Buzzer output 1

34

BZ2

O

Buzzer output 2

35~37

COM1~COM3

O

LCD backplane drive, 3-level voltage out

Absolute Maximum Ratings

Supply voltage.......................0V to 2.0V

Input voltage.............. VSS–0.5V to

VDD+0.5V

Operation Temperature.......–20°C to +75°C

Storage

Temperature.............–55°Cto

+125°C

Note: These are stress ratings only. Stresses exceeding the range specified under “Absolute

Maximum Ratings” may cause substantial damage to the device. Functional operation of this

device at other conditions beyond those listed in the specification is not implied and prolonged

exposure to extreme conditions may affect device reliability.