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74ABT377ADB 데이터시트(PDF) 5 Page - NXP Semiconductors |
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74ABT377ADB 데이터시트(HTML) 5 Page - NXP Semiconductors |
5 / 12 page Philips Semiconductors Product specification 74ABT377A Octal D-type flip-flop with enable 1997 Feb 26 5 DC ELECTRICAL CHARACTERISTICS LIMITS SYMBOL PARAMETER TEST CONDITIONS Tamb = +25°C Tamb = –40°C to +85 °C UNIT MIN TYP MAX MIN MAX VIK Input clamp voltage VCC = 4.5V; IIK = –18mA –0.9 –1.2 –1.2 V VCC = 4.5V; IOH = –3mA; VI = VIL or VIH 2.5 2.9 2.5 V VOH High–level output voltage VCC = 5.0V; IOH = –3mA; VI = VIL or VIH 3.0 3.4 3.0 V VCC = 4.5V; IOH = –32mA; VI = VIL or VIH 2.0 2.4 2.0 V VOL Low-level output voltage VCC = 4.5V; IOL = 64mA; VI = VIL or VIH 0.42 0.55 0.55 V VRST Power-up output low voltage3 VCC = 5.5V; IO = 1mA; VI = GND or VCC 0.13 0.55 0.55 V II Input leakage current VCC = 5.5V; VI = GND or 5.5V ±0.01 ±1.0 ±1.0 µA IOFF Power-off leakage current VCC = 0.0V; VO or VI ≤ 4.5V ±5.0 ±100 ±100 µA ICEX Output High leakage current VCC = 5.5V; VO = 5.5V; VI = GND or VCC 5.0 50 50 µA IO Output current1 VCC = 5.5V; VO = 2.5V –50 –100 –180 –50 –180 mA ICCH Quiescent supply current VCC = 5.5V; Outputs High, VI = GND or VCC 0.5 250 250 µA ICCL VCC = 5.5V; Outputs Low, VI = GND or VCC 24 30 30 mA ∆ICC Additional supply current per input pin2 VCC = 5.5V; one input at 3.4V, other inputs at VCC or GND 0.5 1.5 1.5 mA NOTES: 1. Not more than one output should be tested at a time, and the duration of the test should not exceed one second. 2. This is the increase in supply current for each input at 3.4V. 3. For valid test results, data must not be loaded into the flip-flops (or latches) after applying the power. AC CHARACTERISTICS GND = 0V, tR = tF = 2.5ns, CL = 50pF, RL = 500Ω LIMITS1 SYMBOL PARAMETER WAVEFORM Tamb = +25oC VCC = +5.0V Tamb = -40 to +85oC VCC = +5.0V +0.5V UNIT MIN TYP MAX MIN MAX fMAX Maximum clock frequency 1 150 250 150 MHz tPLH tPHL Propagation delay CP to Qn 1 1.8 2.2 3.1 3.6 4.0 4.7 1.8 2.2 4.8 4.9 ns NOTE: 1. Limits may vary among suppliers. |
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