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GS82032AT-100I 데이터시트(PDF) 11 Page - GSI Technology |
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GS82032AT-100I 데이터시트(HTML) 11 Page - GSI Technology |
11 / 22 page GS82032AT-180/166/150/133/100/66/4/5/6 Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com. Rev: 1.12 10/2004 11/22 © 2000, GSI Technology Note: This parameter is sample tested. Notes: 1. Include scope and jig capacitance. 2. Test conditions as specified with output loading as shown in Fig. 1 unless otherwise noted. 3. Output Load 2 for tLZ, tHZ, tOLZ and tOHZ 4. Device is deselected as defined by the Truth Table. Capacitance (TA = 25°C, f = 1 MHZ, VDD = 3.3 V) Parameter Symbol Test conditions Typ. Max. Unit Control Input Capacitance CI VDD = 3.3 V 34 pF Input Capacitance CIN VIN = 0 V 45 pF Output Capacitance COUT VOUT = 0 V 67 pF AC Test Conditions Parameter Conditions Input high level 2.3 V Input low level 0.2 V Input slew rate 1 V/ns Input reference level 1.25 V Output reference level 1.25 V Output load Fig. 1& 2 20% tKC VSS – 2.0 V 50% VSS VIH Undershoot Measurement and Timing Overshoot Measurement and Timing 20% tKC VDD +- 2.0 V 50% VDD VIL DQ VT = 1.25 V 50 Ω 30pF* DQ 2.5 V Output Load 1 Output Load 2 225 Ω 225 Ω 5pF* * Distributed Test Jig Capacitance |
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