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AM42DL16X4D ๋ฐ์ดํฐ์ํธ(HTML) 39 Page - SPANSION |
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AM42DL16X4D ๋ฐ์ดํฐ์ํธ(HTML) 39 Page - SPANSION |
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38 Am42DL16x4D January 9, 2002 P R E L IMINARY TEST CONDITIONS Table 19. Test Specifications KEY TO SWITCHING WAVEFORMS 2.7 k โฆ CL 6.2 k โฆ 3.3 V Device Under Test Note: Diodes are IN3064 or equivalent Figure 11. Test Setup Test Condition 70, 85 ns Unit Output Load 1 TTL gate Output Load Capacitance, C L (including jig capacitance) 30 pF Input Rise and Fall Times 5 ns Input Pulse Levels 0.0โ3.0 V Input timing measurement reference levels 1.5 V Output timing measurement reference levels 1.5 V WAVEFORM INPUTS OUTPUTS Steady Changing from H to L Changing from L to H Donโt Care, Any Change Permitted Changing, State Unknown Does Not Apply Center Line is High Impedance State (High Z) 3.0 V 0.0 V 1.5 V 1.5 V Output Measurement Level Input Figure 12. Input Waveforms and Measurement Levels |
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