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74ALS38 데이터시트(PDF) 4 Page - NXP Semiconductors |
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74ALS38 데이터시트(HTML) 4 Page - NXP Semiconductors |
4 / 7 page Philips Semiconductors Product specification 74ALS38A Quad 2-input NAND buffer (open collector) 1991 Feb 08 4 AC ELECTRICAL CHARACTERISTICS LIMITS SYMBOL PARAMETER TEST CONDITION Tamb = 0°C to +70°C VCC = +5.0V ± 10% CL = 50pF, RL = 500Ω UNIT MIN MAX tPLH tPHL Propagation delay nA or nB to nY Waveform 1 3.0 3.0 11.0 11.0 ns AC WAVEFORMS For all waveforms, VM = 1.3V. VM VM VM VM tPLH tPHL nA, nB nY SC00004 Waveform 1. Propagation Delay for Data to Output TEST CIRCUIT AND WAVEFORMS tw 90% VM 10% 90% VM 10% 90% VM 10% 90% VM 10% NEGATIVE PULSE POSITIVE PULSE tw AMP (V) 0.3V 0.3V tTHL (tff) INPUT PULSE REQUIREMENTS Rep.Rate tw tTLH tTHL 1MHz 500ns 2.0ns 2.0ns Input Pulse Definition VCC Family 74ALS D.U.T. PULSE GENERATOR RL CL RT VIN VOUT Test Circuit for Open Collector Outputs DEFINITIONS: RL = Load resistor; see AC electrical characteristics for value. CL = Load capacitance includes jig and probe capacitance; see AC electrical characteristics for value. RT = Termination resistance should be equal to ZOUT of pulse generators. tTHL (tf ) tTLH (tr ) tTLH (tr ) AMP (V) Amplitude 3.5V 1.3V VM SC00036 RL 7.0V |
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