전자부품 데이터시트 검색엔진 |
|
74F194 데이터시트(PDF) 5 Page - NXP Semiconductors |
|
74F194 데이터시트(HTML) 5 Page - NXP Semiconductors |
5 / 10 page Philips Semiconductors Product specification 74F194 4-bit bidirectional universal shift register April 4, 1989 5 DC ELECTRICAL CHARACTERISTICS SYMBOL PARAMETER TEST CONDITIONS1 LIMITS UNIT SYMBOL PARAMETER TEST CONDITIONS1 MIN TYP2 MAX UNIT VO High level output voltage3 VCC = MIN, VIL = MAX ±10%VCC 2.5 V VOH High-level output voltage3 VIH = MIN, IOH = MAX ±5%VCC 2.7 3.4 V VO Low level output voltage VCC = MIN, VIL = MAX ±10%VCC 0.30 0.50 V VOL Low-level output voltage VIH = MIN, IOL = MAX ±5%VCC 0.30 0.50 V VIK Input clamp voltage VCC = MIN, II = IIK –0.73 –1.2 V II Input current at maximum input voltage VCC = MAX, VI = 7.0V 100 µA IIH High-level input current VCC = MAX, VI = 2.7V 20 µA IIL Low-level input current VCC = MAX, VI = 0.5V –0.6 mA IOS Short-circuit output current4 VCC = MAX –60 –150 mA ICC Supply current (total)5 VCC = MAX 33 46 mA NOTES: 1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type. 2. All typical values are at VCC = 5V, Tamb = 25°C. 3. Output High state will change to Low stat if an external voltage of less than 0.0V is applied. 4. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. 5. With all outputs open, Di inputs grounded and a 4.5V applied to S0, S1, MR and the serial inputs, ICC is tested with a momentary ground, then 4.5V applied to CP. AC ELECTRICAL CHARACTERISTICS LIMITS SYMBOL PARAMETER TEST CONDITION VCC = +5.0V Tamb = +25°C CL = 50pF, RL = 500Ω VCC = +5.0V ± 10% Tamb = 0°C to +70°C CL = 50pF, RL = 500Ω UNIT MIN TYP MAX MIN MAX fMAX Maximum clock frequency Waveform 1 105 150 90 MHz tPLH tPHL Propagation delay CP to Qn Waveform 1 3.5 3.5 5.2 5.5 7.0 7.0 3.5 3.5 8.0 8.0 ns tPHL Propagation delay MR to Qn Waveform 2 4.5 8.6 12.0 4.5 14.0 ns AC SETUP REQUIREMENTS LIMITS SYMBOL PARAMETER TEST CONDITION VCC = +5.0V Tamb = +25°C CL = 50pF, RL = 500Ω VCC = +5.0V ± 10% Tamb = 0°C to +70°C CL = 50pF, RL = 500Ω UNIT MIN TYP MAX MIN MAX tS(H) tS(L) Setup time, High or Low Dn, DSL, DSR to CP Waveform 3 4.0 4.0 4.0 4.0 ns th(H) th(L) Hold time, High or Low Dn, DSL, DSR to CP Waveform 3 0 0 1.0 1.0 ns tS(H) tS(L) Setup time, High or Low Sn to CP Waveform 3 8.0 8.0 9.0 8.0 ns th(H) th(L) Hold time, High or Low Sn to CP Waveform 3 0 0 0 0 ns tW(H) CP Pulse width, High Waveform 1 5.0 5.5 ns tW(L) MR Pulse width, Low Waveform 2 5.0 5.0 ns tREC Recovery time, MR to CP Waveform 2 7.0 8.0 ns |
유사한 부품 번호 - 74F194 |
|
유사한 설명 - 74F194 |
|
|
링크 URL |
개인정보취급방침 |
ALLDATASHEET.CO.KR |
ALLDATASHEET 가 귀하에 도움이 되셨나요? [ DONATE ] |
Alldatasheet는? | 광고문의 | 운영자에게 연락하기 | 개인정보취급방침 | 링크교환 | 제조사별 검색 All Rights Reserved©Alldatasheet.com |
Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
Family Site : ic2ic.com |
icmetro.com |