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74F410 데이터시트(PDF) 3 Page - NXP Semiconductors |
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74F410 데이터시트(HTML) 3 Page - NXP Semiconductors |
3 / 5 page Philips Semiconductors FAST Products Product specification 74F410 Register stack – 16 ×4 RAM 3-State output register January 8, 1990 3 RECOMMENDED OPERATING CONDITIONS SYMBOL PARAMETER LIMITS T A = – 4 0 t o + 8 5 ° C UNIT MIN NOM MAX VCC Supply voltage 4.5 5.0 5.5 V VIH High–level input voltage 2.0 V VIL Low–level input voltage 0.8 V IIk Input clamp current –18 mA IOH High–level output current –3 mA IOL Low–level output current 24 mA Tamb Operating free air temperature range 0 +70 °C DC ELECTRICAL CHARACTERISTICS (Over recommended operating free-air temperature range unless otherwise noted.) SYMBOL PARAMETER TEST CONDITIONS1 LIMITS UNIT MIN TYP2 MAX VOH High-level output voltage VCC = MIN, VIL = MAX ±10%V CC 2.4 V VIH = MIN, IOH = MAX ±5%V CC 2.7 V VOL Low-level output voltage VCC = MIN, VIL = MAX ±10%V CC 0.35 0.50 V VIH = MIN, IOL = MAX ±5%V CC 0.35 0.50 V VIK Input clamp voltage VCC = MIN, II = IIK -0.73 -1.2 V II Input current at maximum input voltage VCC = MAX, VI = 7.0V 100 µA IIH High–level input current VCC = MAX, VI = 2.7V 20 µA IIL Low–level input current others VCC = MAX, VI = 0.5V -0.6 mA CP, CS -1.2 mA IOZH Offset–output current, high–level voltage applied VCC = MAX, VI = 2.7V 50 µA IOZL Offset–output current, low–level voltage applied VCC = MAX, VI = 0.5V –50 µA IOS Short-circuit output current3 VCC = MAX -60 -150 mA ICC Supply current (total) VCC = MAX 45 70 mA NOTES: 1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type. 2. All typical values are at VCC = 5V, Tamb = 25°C. 3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. |
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