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74F646A 데이터시트(PDF) 7 Page - NXP Semiconductors |
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74F646A 데이터시트(HTML) 7 Page - NXP Semiconductors |
7 / 16 page Philips Semiconductors Product specification 74F646/A/74F648/A Transceivers/registers 1990 Sep 25 7 DC ELECTRICAL CHARACTERISTICS (Over recommended operating free-air temperature range unless otherwise noted.) SYMBOL PARAMETER TEST LIMITS UNIT CONDITIONS1 MIN TYP2 MAX VCC = MIN, IOH = –3mA ±10%VCC 2.4 V VOH High-level output voltage VIL = MAX, ±5%VCC 2.7 3.4 V VIH = MIN IOH = –15mA ±10%VCC 2.0 V VOL Low-level output voltage All VCC = MIN, VIL = MAX, IOL = 48mA ±10%VCC 0.38 0.55 V 74F646/74F648 only VIH = MIN IOL = 64mA ±5%VCC 0.42 0.55 V VIK Input clamp voltage VCC = MIN, II = IIK –0.73 -1.2 V II Input current at others VCC = 0.0V, VI = 7.0V 100 µA maximum input voltage A0–A7, B0–B7 VCC = MAX, VI = 5.5V 1 mA IIH High–level input current OE, DIR, CPAB, VCC = MAX, VI = 2.7V 20 µA IIL Low–level input current CPBA, SAB, SBA VCC = MAX, VI = 0.5V –20 µA IOZH + IIH Off–state output current, high–level voltage applied A0 – A7, B0 –B7 VCC = MAX, VO = 2.7V 70 µA IOZL + IIL Off–state output current, low–level voltage applied VCC = MAX, VO = 0.5V –70 µA IOS Short–circuit output current3 74F646, 74F648 VCC = MAX -100 -225 mA IO Output current4 74F646A, 74F648A VCC = MAX, V0 = 2.25V -60 -150 mA 74F646, ICCH 125 165 mA 74F648 ICCL VCC = MAX 160 210 mA ICC Supply current (total) ICCZ 135 160 mA 74F646A, ICCH 100 145 mA 74F648A ICCL VCC = MAX 110 155 mA ICCZ 105 155 mA NOTES: 1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type. Unless otherwise specified, VX = VCC for all test conditions. 2. All typical values are at VCC = 5V, Tamb = 25°C. 3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. 4. IO is tested under conditions that produce current approximately one half of the true short–circuit output current (IOS). |
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