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74F646A 데이터시트(PDF) 7 Page - NXP Semiconductors

부품명 74F646A
상세설명  Octal transceiver/register, non-inverting 3-State
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제조업체  PHILIPS [NXP Semiconductors]
홈페이지  http://www.nxp.com
Logo PHILIPS - NXP Semiconductors

74F646A 데이터시트(HTML) 7 Page - NXP Semiconductors

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Philips Semiconductors
Product specification
74F646/A/74F648/A
Transceivers/registers
1990 Sep 25
7
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST
LIMITS
UNIT
CONDITIONS1
MIN
TYP2
MAX
VCC = MIN,
IOH = –3mA
±10%VCC
2.4
V
VOH
High-level output voltage
VIL = MAX,
±5%VCC
2.7
3.4
V
VIH = MIN
IOH =
–15mA
±10%VCC
2.0
V
VOL
Low-level output voltage
All
VCC = MIN,
VIL = MAX,
IOL = 48mA
±10%VCC
0.38
0.55
V
74F646/74F648 only
VIH = MIN
IOL = 64mA
±5%VCC
0.42
0.55
V
VIK
Input clamp voltage
VCC = MIN, II = IIK
–0.73
-1.2
V
II
Input current at
others
VCC = 0.0V, VI = 7.0V
100
µA
maximum input voltage
A0–A7, B0–B7
VCC = MAX, VI = 5.5V
1
mA
IIH
High–level input current
OE, DIR, CPAB,
VCC = MAX, VI = 2.7V
20
µA
IIL
Low–level input current
CPBA, SAB, SBA
VCC = MAX, VI = 0.5V
–20
µA
IOZH + IIH
Off–state output current,
high–level voltage applied
A0 – A7, B0 –B7
VCC = MAX, VO = 2.7V
70
µA
IOZL + IIL
Off–state output current,
low–level voltage applied
VCC = MAX, VO = 0.5V
–70
µA
IOS
Short–circuit output current3
74F646, 74F648
VCC = MAX
-100
-225
mA
IO
Output current4
74F646A, 74F648A
VCC = MAX, V0 = 2.25V
-60
-150
mA
74F646,
ICCH
125
165
mA
74F648
ICCL
VCC = MAX
160
210
mA
ICC
Supply current (total)
ICCZ
135
160
mA
74F646A,
ICCH
100
145
mA
74F648A
ICCL
VCC = MAX
110
155
mA
ICCZ
105
155
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
Unless otherwise specified, VX = VCC for all test conditions.
2. All typical values are at VCC = 5V, Tamb = 25°C.
3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.
4. IO is tested under conditions that produce current approximately one half of the true short–circuit output current (IOS).


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