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SN74HC08NSRE4 데이터시트(PDF) 1 Page - Texas Instruments |
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SN74HC08NSRE4 데이터시트(HTML) 1 Page - Texas Instruments |
1 / 16 page www.ti.com FEATURES SN54HC04...JORWPACKAGE SN74HC04...D,DB,N,NS,ORPWPACKAGE (TOP VIEW) 1A V CC 1 14 1B 4B 2 13 1Y 4A 3 12 2A 4Y 4 11 2B 3B 5 10 2Y 3A 6 9 GND 3Y 7 8 SN54HC04...FKPACKAGE (TOP VIEW) NC Nointernalconnection – 4 5 6 7 18 17 16 15 4A NC 4Y NC 3B 14 1Y NC 2A NC 2B 8 1 20 2 19 3 13 9 12 10 11 DESCRIPTION/ORDERING INFORMATION Y = A • B or Y = A +B in positive logic. SN54HC08, SN74HC08 QUADRUPLE 2-INPUT POSITIVE-AND GATES SCLS081F – DECEMBER 1982 – REVISED JANUARY 2007 • Wide Operating Voltage Range of 2 V to 6 V • Typical t pd = 8 ns • Outputs Can Drive Up To 10 LSTTL Loads • ±4-mA Output Drive at 5 V • Low Power Consumption, 20-µA Max I CC • Low Input Current of 1 µA Max The ’HC08 devices contain four independent 2-input AND gates. They perform the Boolean function ORDERING INFORMATION TA PACKAGE(1) ODERABLE PART NUMBER TOP-SIDE MARKING PDIP – N Reel of 1000 SN74HC08N SN74HC08N Reel of 1000 SN74HC08DE4 SOIC – D Reel of 2500 SN74HC08DR HC08 Tube of 250 SN74HC08DT SN74HC08NSR SOP – NS Reel of 2000 HC08 –40 °C to 85°C SN74HC08NSRG4 SN74HC08DBR SSOP – DB Reel of 2000 HC08 SN74HC08DBRE4 Tube of 90 SN74HC08PW TSSOP – PW Reel of 2000 SN74HC08PWR HC08 Tube of 250 SN74HC08PWT CDIP – J Reel of 1000 SNJ54HC08J SNJ54HC08J –55 °C to 125°C CFP – W Reel of 900 SNJ54HC08W SNJ54HC08W LCCC –FK Reel of 2200 SNJ54HC08FK SNJ54HC08JFK (1) Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at www.ti.com/sc/package. Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. PRODUCTION DATA information is current as of publication date. Copyright © 1982–2007, Texas Instruments Incorporated Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. |
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