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CAT28C257G-15T 데이터시트(PDF) 3 Page - Catalyst Semiconductor |
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CAT28C257G-15T 데이터시트(HTML) 3 Page - Catalyst Semiconductor |
3 / 12 page CAT28C257 3 Doc. No. 1015, Rev. D D.C. OPERATING CHARACTERISTICS VCC = 5V ±10%, unless otherwise specified. Symbol Parameter Test Conditions Min Typ Max Units ICC VCC Current (Operating, TTL) CE = OE = VIL, f=6MHz 30 mA All I/O’s Open ICCC(5) VCC Current (Operating, CMOS) CE = OE = VILC, f=6MHz 25 mA All I/O’s Open ISB VCC Current (Standby, TTL) CE = VIH, All I/O’s Open 1 mA ISBC(6) VCC Current (Standby, CMOS) CE = VIHC, 150 µA All I/O’s Open ILI Input Leakage Current VIN = GND to VCC –10 10 µA ILO Output Leakage Current VOUT = GND to VCC, –10 10 µA CE = VIH VIH(6) High Level Input Voltage 2 VCC +0.3 V VIL(5) Low Level Input Voltage –0.3 0.8 V VOH High Level Output Voltage IOH = –400 µA 2.4 V VOL Low Level Output Voltage IOL = 2.1mA 0.4 V VWI Write Inhibit Voltage 3.5 V *COMMENT Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions outside of those listed in the operational sections of this specifica- tion is not implied. Exposure to any absolute maximum rating for extended periods may affect device perfor- mance and reliability. ABSOLUTE MAXIMUM RATINGS* Temperature Under Bias .................. -55 °C to +125°C Storage Temperature ........................ -65 °C to +150°C Voltage on Any Pin with Respect to Ground(2) ............ -2.0V to +VCC + 2.0V VCC with Respect to Ground ................ -2.0V to +7.0V Package Power Dissipation Capability (Ta = 25 °C)................................... 1.0W Lead Soldering Temperature (10 secs) ............ 300 °C Output Short Circuit Current(3) ........................ 100 mA RELIABILITY CHARACTERISTICS Symbol Parameter Test Method Min Typ Max Units NEND(1) Endurance MIL-STD-883, Test Method 1033 104 or 105 Cycles/Byte TDR(1) Data Retention MIL-STD-883, Test Method 1008 100 Years VZAP(1) ESD Susceptibility MIL-STD-883, Test Method 3015 2000 Volts ILTH(1)(4) Latch-Up JEDEC Standard 17 100 mA Note: (1) This parameter is tested initially and after a design or process change that affects the parameter. (2) The minimum DC input voltage is –0.5V. During transitions, inputs may undershoot to –2.0V for periods of less than 20 ns. Maximum DC voltage on output pins is VCC +0.5V, which may overshoot to VCC +2.0V for periods of less than 20 ns. (3) Output shorted for no more than one second. No more than one output shorted at a time. (4) Latch-up protection is provided for stresses up to 100mA on address and data pins from –1V to VCC +1V. (5) VILC = –0.3V to +0.3V. (6) VIHC = VCC –0.3V to VCC +0.3V. |
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