전자부품 데이터시트 검색엔진 |
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NBSG16M 데이터시트(PDF) 7 Page - ON Semiconductor |
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NBSG16M 데이터시트(HTML) 7 Page - ON Semiconductor |
7 / 11 page NBSG16M http://onsemi.com 7 Table 7. DC CHARACTERISTICS, NEGATIVE CML OUTPUT VCC = 0 V; VEE = −3.465 to −2.375 V (Note 12) Symbol Characteristic −40°C 25°C 85°C Unit Min Typ Max Min Typ Max Min Typ Max ICC Positive Power Supply Current 37 43 51 37 43 51 37 43 51 mA VOH Output HIGH Voltage (Note 13) VCC − 40 VCC − 10 VCC VCC − 40 VCC − 10 VCC VCC − 40 VCC − 10 VCC mV VOL Output LOW Voltage (Note 12) VCC − 400 VCC − 330 VCC − 400 VCC − 330 VCC − 400 VCC − 330 mV VIH Input HIGH Voltage (Single−Ended) (Note 13) VEE + 1.275 VCC − 1.0* VCC VEE + 1.275 VCC − 1.0* VCC VEE + 1.275 VCC − 1.0* VCC V VIL Input LOW Voltage (Single−Ended) (Note 13) VEE VCC − 1.4* VIH− 0.150 VEE VCC − 1.4* VIH− 0.150 VEE VCC − 1.4* VIH− 0.150 V VBB ECL Reference Voltage Output −1425 −1330 −1235 −1425 −1330 −1235 −1425 −1330 −1235 mV VIHCMR Input HIGH Voltage Common Mode Range (Note 14) (Differential Configuration) VEE+1.2 VCC VEE+1.2 VCC VEE+1.2 VCC V RTIN Internal Input Termination Resistor 45 50 55 45 50 55 45 50 55 W RTOUT Internal Output Termination Resistor 45 50 55 45 50 55 45 50 55 W IIH Input HIGH Current (@ VIH) 60 100 60 100 60 100 mA IIL Input LOW Current (@ VIL) 25 50 25 50 25 50 mA NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit values are applied individually under normal operating conditions and not valid simultaneously. 12.Input and output parameters vary 1:1 with VCC. 13.All loading with 50 W to VCC. 14.VIHCMR min varies 1:1 with VEE, VIHCMR max varies 1:1 with VCC. The VIHCMR range is referenced to the most positive side of the differen- tial input signal. *Typicals used for testing purposes. |
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