 |
전자부품 데이터시트 검색엔진 |
|
|
전자부품 데이터시트 검색엔진 |
|
AM29BDS643G 데이터시트(HTML) 34 Page - Advanced Micro Devices |
|
||||||||||||||||||||||||||||||
AM29BDS643G 데이터시트(HTML) 34 Page - Advanced Micro Devices |
|
|
34 / 49 page 
32 Am29BDS643G 25692A2 May 8, 2006 D A TA SH EE T TEST CONDITIONS Table 13. Test Specifications KEY TO SWITCHING WAVEFORMS SWITCHING WAVEFORMS CL Device Under Test Figure 7. Test Setup Test Condition All Speeds Unit Output Load Capacitance, CL (including jig capacitance) 30 pF Input Rise and Fall Times 5 ns Input Pulse Levels 0.0–VCC V Input timing measurement reference levels VCC/2 V Output timing measurement reference levels VCC/2 V WAVEFORM INPUTS OUTPUTS Steady Changing from H to L Changing from L to H Don’t Care, Any Change Permitted Changing, State Unknown Does Not Apply Center Line is High Impedance State (High Z) VCC 0.0 V Output Measurement Level Input VCC/2 VCC/2 Figure 8. Input Waveforms and Measurement Levels |
Korean ▼ 
English
Chinese
German
Japanese
Russian
Spanish
French
Italian
Portuguese
Polish
Vietnamese
