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전자부품 데이터시트 검색엔진 |
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AM29BDS643G 데이터시트(HTML) 13 Page - Advanced Micro Devices |
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AM29BDS643G 데이터시트(HTML) 13 Page - Advanced Micro Devices |
13 / 49 page ![]() May 8, 2006 25692A2 Am29BDS643G 11 D A TA SH EE T Power Saving Function The Power Save function reduces the amount of switching on the data output bus by changing the minimum number of bits possible, thereby reducing power consumption. This function is active only during burst mode operations. The device compares the word previously output to the system with the new word to be output. If the number of bits to be switched is 0–8 (less than half the bus width), the device simply outputs the new word on the data bus. If, however, the number of bits that must be switched is 9 or higher, the data is inverted before being output on the data bus. This effectively limits the maximum number of bits that are switched for any given read cycle to eight. The device indicates to the system whether or not the data is inverted via the PS (power saving) output. If the word on the data bus is not inverted, PS = VIL; if the word on the data bus is inverted, PS = VIH. During initial power up the PS function is disabled. To enable the PS function, the system must write the Enable PS command sequence to the flash device (see the Command Definitions table). When the PS function is enabled, one additional clock cycle is inserted during the initial and second access of a burst sequence. See Figure 20. The RDY output indi- cates this condition to the system. The device is also capable of receiving inverted data during command and write operations. The host system must indicate to the device via the PS input whether or not the input data is inverted. PS must be driven to VIH for inverted data, or to VIL for non-inverted data. To disable the PS function, the system must hardware reset the device (drive the RESET# input low). Simultaneous Read/Write Operations with Zero Latency This device is capable of reading data from one bank of memory while programming or erasing in one of the other three banks of memory. An erase operation may also be suspended to read from or program to another location within the same bank (except the sector being erased). Figure 22 shows how read and write cycles may be initiated for simultaneous operation with zero latency. Refer to the DC Characteristics table for read-while-program and read-while-erase current specifications. Writing Commands/Command Sequences The device has inputs/outputs that accept both ad- dress and data information. To write a command or command sequence (which includes programming data to the device and erasing sectors of memory), the system must drive AVD# and CE# to VIL, and OE# to VIH when providing an address to the device, and drive WE# and CE# to VIL, and OE# to VIH. when writ- ing commands or data. The device features an Unlock Bypass mode to facili- tate faster programming. Once the device enters the Unlock Bypass mode, only two write cycles are re- quired to program a word, instead of four. An erase operation can erase one sector, multiple sec- tors, or the entire device. Table 7 indicates the address space that each sector occupies. The device address space is divided into four banks: Banks A and B con- tain both 8 Kword boot sectors in addition to 32 Kword sectors, while Banks C and D contain only 32 Kword sectors. A “bank address” is the address bits required to uniquely select a bank. Similarly, a “sector address” is the address bits required to uniquely select a sector. Refer to the DC Characteristics table for write mode current specifications. The AC Characteristics section contains timing specification tables and timing dia- grams for write operations. Accelerated Program Operation The device offers accelerated program operations through the VPP input. This function is primarily in- tended to allow faster manufacturing throughput at the factory. If the system asserts VID on this input, the de- vice automatically enters the aforementioned Unlock Bypass mode and uses the higher voltage on the input to reduce the time required for program operations. The system would use a two-cycle program command sequence as required by the Unlock Bypass mode. Removing VID from the VPP input returns the device to normal operation. Autoselect Functions If the system writes the autoselect command se- quence, the device enters the autoselect mode. The system can then read autoselect codes from the inter- nal register (which is separate from the memory array) on DQ7–DQ0. Standard read cycle timings apply in this mode. Refer to the Autoselect Functions and Au- toselect Command Sequence sections for more information. Standby Mode When the system is not reading or writing to the de- vice, it can place the device in the standby mode. In this mode, current consumption is greatly reduced, and the outputs are placed in the high impedance state, independent of the OE# input. The device enters the CMOS standby mode when the CE# and RESET# inputs are both held at VCC ± 0.2 V. The device requires standard access time (tCE) for |