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AM42BDS640AG 데이터시트(PDF) 69 Page - Advanced Micro Devices |
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AM42BDS640AG 데이터시트(HTML) 69 Page - Advanced Micro Devices |
69 / 72 page 68 Am42BDS640AG November 1, 2002 P R E L I M INARY FLASH ERASE AND PROGRAMMING PERFORMANCE Notes: 1. Typical program and erase times assume the following conditions: 25 °C, 2.0 V V CC, 1,000,000 cycles. Additionally, programming typicals assume checkerboard pattern. 2. Under worst case conditions of 90 °C, V CC = 1.8 V, 1,000,000 cycles. 3. The typical chip programming time is considerably less than the maximum chip programming time listed, since most bytes program faster than the maximum program times listed. 4. In the pre-programming step of the Embedded Erase algorithm, all bytes are programmed to 00h before erasure. 5. System-level overhead is the time required to execute the two- or four-bus-cycle sequence for the program command. See Table 14 for further information on command definitions. 6. The device has a minimum erase and program cycle endurance of 1,000,000 cycles. FLASH LATCHUP CHARACTERISTICS Note: Includes all pins except V CC. Test conditions: VCC = 3.0 V, one pin at a time. PACKAGE PIN CAPACITANCE Note:Test conditions T A = 25°C, f = 1.0 MHz. FLASH DATA RETENTION Parameter Typ (Note 1) Max (Note 2) Unit Comments Sector Erase Time (32 Kword or 8 Kword) 0.4 5 sec Excludes 00h programming prior to erasure (Note 4) Chip Erase Time 54 sec Word Program Time 11.5 210 µs Excludes system level overhead (Note 5) Accelerated Word Program Time 4 120 µs Chip Program Time (Note 3) 48 144 sec Accelerated Chip Program Time 16 48 sec Description Min Max Input voltage with respect to VSS on all pins except I/O pins (including OE#, and RESET#) –1.0 V 12.5 V Input voltage with respect to V SS on all I/O pins –1.0 V V CC + 1.0 V V CC Current –100 mA +100 mA Parameter Symbol Description Test Setup Typ Max Unit C IN Input Capacitance V IN = 0 11 14 pF C OUT Output Capacitance V OUT = 0 12 16 pF C IN2 Control Pin Capacitance V IN = 0 14 16 pF C IN3 WP#/ACC Pin Capacitance V IN = 0 17 20 pF Parameter Description Test Conditions Min Unit Minimum Pattern Data Retention Time 150 °C10 Years 125 °C20 Years |
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