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AM79R70-1JC 데이터시트(PDF) 6 Page - Advanced Micro Devices |
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AM79R70-1JC 데이터시트(HTML) 6 Page - Advanced Micro Devices |
6 / 20 page 6 Am79R70 Data Sheet ABSOLUTE MAXIMUM RATINGS Storage temperature ......................... –55°C to +150°C VCC with respect to AGND/DGND .......... 0.4 V to +7 V VNEG with respect to AGND/DGND ...... 0.4 V to VBAT2 VBAT2 ....................................................VBAT1 to GND VBAT1 with respect to AGND/DGND: Continuous..................................... +0.4 V to –80 V 10 ms ............................................. +0.4 V to –85 V BGND with respect to AGND/DGND........ +3 V to –3 V A(TIP) or B(RING) to BGND: Continuous ...............................VBAT1 –5 V to +1 V 10 ms (f = 0.1 Hz) ..................VBAT1 –10 V to +5 V 1 µs (f = 0.1 Hz) .....................VBAT1 –15 V to +8 V 250 ns (f = 0.1 Hz) ...............VBAT1 –20 V to +12 V Current from A(TIP) or B(RING).....................±150 mA RYOUT1, RYOUT2 current................................ 75 mA RYOUT1, RYOUT2 voltage ..................... RYE to +7 V RYOUT1, RYOUT2 transient ................. RYE to +10 V RYE voltage ........................................ BGND to VBAT1 C3–C1, D2–D1, E1, B2EN, and RINGIN Input voltage .........................–0.4 V to VCC + 0.4 V Maximum power dissipation, continuous, TA = 70°C, No heat sink (See note): In 32-pin PLCC package.............................. 1.67 W In 28-pin SOIC package .............................. 1.25 W Thermal Data: ................................................................ θJA In 32-pin PLCC package....................... 45°C/W typ In 28-pin SOIC package ........................ 60 °C/W typ Note: Thermal limiting circuitry on chip will shut down the circuit at a junction temperature of about 165°C. The device should never see this temperature and operation above 145°C junction temperature may degrade device reliability. See the SLIC Packaging Considerations for more information. Stresses above those listed under Absolute Maximum Ratings may cause permanent device failure. Functionality at or above these limits is not implied. Exposure to Absolute Maximum Ratings for extended periods may affect device reliability. OPERATING RANGES Commercial (C) Devices Ambient temperature ............................. 0°C to +70°C* VCC ..................................................... 4.75 V to 5.25 V VNEG ..................................................–4.75 V to VBAT2 VBAT1.................................................... –40 V to –67 V VBAT2....................................................–19 V to VBAT1 AGND/DGND.......................................................... 0 V BGND with respect to AGND/DGND ........................ –100 mV to +100 mV Load resistance on VTX to ground .............. 20 k Ω min The Operating Ranges define those limits between which the functionality of the device is guaranteed. * Functionality of the device from 0 °C to +70°C is guaranteed by production testing. |
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