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P4C147 ๋ฐ์ดํ„ฐ์‹œํŠธ(HTML) 5 Page - Pyramid Semiconductor Corporation

๋ถ€ํ’ˆ๋ช… P4C147
์ƒ์„ธ๋‚ด์šฉ  ULTRA HIGH SPEED 4K x 1 STATIC CMOS RAM
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์ œ์กฐ์‚ฌ  PYRAMID [Pyramid Semiconductor Corporation]
ํ™ˆํŽ˜์ด์ง€  http://www.pyramidsemiconductor.com
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P4C147 ๋ฐ์ดํ„ฐ์‹œํŠธ(HTML) 5 Page - Pyramid Semiconductor Corporation

 
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P4C147
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Document # SRAM103 REV A
Input Pulse Levels
GND to 3.0V
Input Rise and Fall Times
3ns
Input Timing Reference Level
1.5V
Output Timing Reference Level
1.5V
Output Load
See Figures 1 and 2
Mode
CE
CE
CE
CE
CE
WE
WE
WE
WE
WE
Output
Power
Standby
H
X
High Z
Standby
Read
L
H
D
OUT
Active
Write
L
L
High Z
Active
TRUTH TABLE
AC TEST CONDITIONS
Figure 1. Output Load
Figure 2. Thevenin Equivalent
* including scope and test fixture.
Note:
Due to the ultra-high speed of the P4C147, care must be taken when
testing this device; an inadequate setup can cause a normal functioning
part to be rejected as faulty. Long high-inductance leads that cause
supply bounce must be avoided by bringing the V
CC and ground planes
directly up to the contactor fingers. A 0.01 ยตF high frequency capacitor
is also required between V
CC and ground. To avoid signal reflections,
proper termination must be used; for example, a 50
โ„ฆ test environment
should be terminated into a 50
โ„ฆ load with 1.73V (Thevenin Voltage) at
the comparator input, and a 116
โ„ฆ resistor must be used in series with
D
OUT to match 166โ„ฆ (Thevenin Resistance).


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