M28LV64 datasheet(7/18 Pages) STMICROELECTRONICS

부품명	M28LV64

상세설명	64K 8K x 8 LOW VOLTAGE PARALLEL EEPROM with SOFTWARE DATA PROTECTION

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제조업체	STMICROELECTRONICS [STMicroelectronics]

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Symbol

Parameter

Test Condition

Min

Max

Unit

CIN

Input Capacitance

VIN =0V

6

pF

COUT

Output Capacitance

VOUT =0V

12

pF

Note: 1. Sampled only, not 100% tested.

Table 4. Capacitance (1) (TA =25

°C, f = 1 MHz )

Symbol

Parameter

Test Condition

Min

Max

Unit

ILI

Input Leakage Current

0V

≤ VIN ≤ VCC

1019

µA

ILO

Output Leakage Current

0V

≤ VIN ≤ VCC

10

µA

ICC

(1)

Supply Current

(CMOS inputs)

E= VIL,G = VIL, f = 5 MHz, VCC = 3.3V

8

mA

E= VIL,G = VIL, f = 5 MHz, VCC = 3.6V

10

mA

ICC2

(1)

Supply Current (Standby)

CMOS

E> VCC –0.3V

20

µA

VIL

Input Low Voltage

– 0.3

0.6

V

VIH

Input High Voltage

2

VCC +0.5

V

VOL

Output Low Voltage

IOL = 1 mA

0.2 VCC

V

VOH

Output High Voltage

IOH = 1 mA

0.8 VCC

V

Note: 1. All I/O’s open circuit.

Table 5. Read Mode DC Characteristics

(TA = 0 to 70

°C or –40 to 85°C; VCC = 2.7V to 3.6V)

Symbol

Parameter

Min

Max

Unit

tPUR

Time Delay to Read Operation

1

µs

tPUW

Time Delay to Write Operation (once VCC

≥ 4.5V)

15

ms

VWI

Write Inhibit Threshold

1.5

2.5

V

Note: 1. Sampled only, not 100% tested.

Table 6. Power Up Timing (1) (TA = 0 to 70

°C or –40 to 85°C; VCC = 2.7V to 3.6V)

Input Rise and Fall Times

≤ 20ns

Input Pulse Voltages

0V to VCC -0.3V

Input and Output Timing Ref. Voltages

1.5V

AC MEASUREMENT CONDITIONS

Note that Output Hi-Z is defined as the point where data

is no longer driven.

AI01274

VCC –0.3V

0V

0.5 VCC

Figure 7. AC Testing Input Output Waveforms

AI01396

VCC

OUT

CL = 100pF

CL includes JIG capacitance

1.8k

Ω

DEVICE

UNDER

TEST

1.3k

Ω

Figure 8. AC Testing Equivalent Load Circuit

7/18

M28LV64

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