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전자부품 데이터시트 검색엔진 |
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전자부품 데이터시트 검색엔진 |
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FSUSB31K8X 데이터시트(PDF) 8 Page - Fairchild Semiconductor |
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FSUSB31K8X 데이터시트(HTML) 8 Page - Fairchild Semiconductor |
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8 / 14 page  © 2006 Fairchild Semiconductor Corporation www.fairchildsemi.com FSUSB31 Rev. 1.0.8 8 Test Diagrams (Continued) Figure 14. Break-Before-Make (tBBM) Figure 15. Switch Skew Tests Figure 16. Bandwidth tD tR = tF = 2.5ns (10–90%) RL S CL* HSDn HSDn VO Control Input D+, D– GND Control Input 50% VCC 0V VOUT VOUT VCC VCC 0.9 x VOUT *CL includes test fixture and stray capacitance. tRISE = 500ps tPLH tPHL nput: Output: D+, D– HSDn+ HSDn– tFALL = 500ps VOH 90% 90% 50% 50% 10% 10% 50% 50% VOL 800mV TSK(P) = | tPHL – tPLH | Pulse Skew, TSK(P) 400mV tRISE = 500ps tPLH1 tPHL1 Output1: Input: D+, D– Output1: D2+, D2– HSD1+ HSD1– tFALL = 500ps VOH 90% 90% 50% 50% 10% 10% 50% 50% VOL 800mV TSK(O) = | tPLH1 – tPLH2 | or | tPHL1 – tPHL2 | Output Skew, TSK(OUT) 400mV tPLH2 tPHL2 VOH 50% 50% VOL RS VIN FSUSB31 GND VOE Network Analyzer VOUT GND VS GND RT GND GND RS and RT are functions of the application environment (see AC Electrical Tables for specific values). |
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유사한 설명 - FSUSB31K8X |
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