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TC7109IJL 데이터시트(PDF) 2 Page - TelCom Semiconductor, Inc |
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TC7109IJL 데이터시트(HTML) 2 Page - TelCom Semiconductor, Inc |
2 / 21 page 3-92 TELCOM SEMICONDUCTOR, INC. ABSOLUTE MAXIMUM RATINGS* Positive Supply Voltage (GND to V+) ..................... +6.2V Negative Supply voltage (GND to V–) ....................... –9V Analog Input Voltage (Low to High) (Note 1) ....... V+ to V– Reference Input Voltage (Low to High (Note 1) .. V+ to V– Digital Input Voltage (Pins 2–27) (Note 2) ..... GND –0.3V Power Dissipation, TA < 70°C, (Note 3) CerDIP ............................................................. 2.29W Plastic DIP ....................................................... 1.23W PLCC ............................................................... 1.23W PQFP ............................................................... 1.00W Operating Temperature Range Plastic Package (C) ............................... 0 °C to +70°C Ceramic Package (I) ....................... – 25 °C to +85°C (M) ................... – 55 °C to +125°C Storage Temperature Range ............... – 65 °C to +150°C Lead Temperature (Soldering, 10 sec) ................. +300 °C ELECTRICAL CHARACTERISTICS: All parameters with V+ = +5V, V– = –5V, GND = 0V, TA = +25°C, unless otherwise indicated. Symbol Parameter Test Conditions Min Typ Max Unit Analog Overload Recovery Time — 0 1 Measurement (TC7109A) Cycle Zero Input Reading VIN = 0V – 00008 ±00008 +00008 Octal Reading Full Scale = 409.6 mV Ratio Metric Reading VIN = VREF 37778 37778 40008 Octal Reading VREF = 204.8 mV 40008 NL Nonlinearity (Max Deviation Full Scale = 409.6 mV to –1 ±0.2 +1 Count From Best Straight Line Fit) 2.048V Over Full Operating Temperature Range Roll-Over Error (Difference in Full Scale = 409.6 mV to –1 ±0.02 +1 Count Reading for Equal Positive and 2.048V Over Full Operating Negative Inputs Near (Full Scale) Temperature Range CMRR Input Common-Mode VCM ±1V, VIN = 0V — 50 — µV/V Rejection Ratio Full Scale = 409.6 mV VCMR Common-Mode Voltage Input High, Input Low, V–+1.5 — V+–1 V Range and Common Pins eN Noise (P-P Value Not VIN = 0V — 15 — µV Exceeded 95% of Time) Full Scale = 409.6 mV IIN Leakage Current at Input VIN, All Packages: +25°C— 1 10 pA C Device: 0 °C ≤ TA ≤ +70°C 20 100 pA I Device: –25 °C ≤ TA ≤ +85°C 100 250 pA M Device: –55 °C ≤ TA ≤ +125°C2 5 nA TCZS Zero Reading Drift VIN = 0V — 0.2 1 µV/°C TCFS Scale-Factor VIN = 408.9 mV = >77708 —1 5 µV/°C Temperature Coefficient Reading, Ext Ref = 0 ppm/ °C I+ Supply Current VIN = 0V, Crystal Oscillator — 700 1500 µA (V+ to GND) 3.58 MHz Test Circuit IS Supply Current (V+ to V–) Pins 2–21, 25, 26, 27, 29 Open — 700 1500 µA *Static-sensitive device. Unused devices must be stored in conductive material. Protect devices from static discharge and static fields. Stresses above those listed under Absolute Maximum Ratings may cause perma- nent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions above those indicated in the operational sections of the specifications is not implied. Exposure to Absolute Maximum Rating Conditions for extended periods may affect device reliability. NOTES: 1. Input voltages may exceed supply voltages if input current is limited to ±100 µA. 2. Connecting any digital inputs or outputs to voltages greater than V+ or less than GND may cause destructive device latch- up. Therefore, it is recommended that inputs from sources other than the same power supply should not be applied to the TC7109A before its power supply is established. In multiple supply systems, the supply to the device should be activated first. 3. This limit refers to that of the package and will not occur during normal operation. TC7109 TC7109A 12-BIT µP-COMPATIBLE ANALOG-TO-DIGITAL CONVERTERS |
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