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74FCT162H501ETPVCT 데이터시트(PDF) 3 Page - Texas Instruments |
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74FCT162H501ETPVCT 데이터시트(HTML) 3 Page - Texas Instruments |
3 / 8 page CY74FCT16501T CY74FCT162501T CY74FCT162H501T 3 Electrical Characteristics Over the Operating Range Parameter Description Test Conditions Min. Typ.[8] Max. Unit VIH Input HIGH Voltage 2.0 V VIL Input LOW Voltage 0.8 V VH Input Hysteresis[9] 100 mV VIK Input Clamp Diode Voltage VCC=Min., IIN=−18 mA −0.7 −1.2 V IIH Input HIGH Current Standard VCC=Max., VI=VCC ±1 µA Bus Hold ±100 IIL Input LOW Current Standard VCC=Max., VI=GND ±1 µA Bus Hold ±100 µA IBBH IBBL Bus Hold Sustain Current on Bus Hold Input[10] VCC=Min., VI=2.0V −50 µA VI=0.8V +50 µA IBHHO IBHLO Bus Hold Overdrive Current on Bus Hold In- put[10] VCC=Max., VI=1.5V TBD mA IOZH High Impedance Output Current (Three-State Output pins) VCC=Max., VOUT=2.7V ±1 µA IOZL High Impedance Output Current (Three-State Output pins) VCC=Max., VOUT=0.5V ±1 µA IOS Short Circuit Current[11] VCC=Max., VOUT=GND −80 −140 −200 mA IO Output Drive Current[11] VCC=Max., VOUT=2.5V −50 −180 mA IOFF Power-Off Disable VCC=0V, VOUT≤4.5V [12] ±1 µA Output Drive Characteristics for CY74FCT16501T Parameter Description Test Conditions Min. Typ.[8] Max. Unit VOH Output HIGH Voltage VCC=Min., IOH=−3 mA 2.5 3.5 V VCC=Min., IOH=−15 mA 2.4 3.5 VCC=Min., IOH=−32 mA 2.0 3.0 VOL Output LOW Voltage VCC=Min., IOL=64 mA 0.2 0.55 V Output Drive Characteristics for CY74FCT162501T, CY74FCT162H501T Parameter Description Test Conditions Min. Typ.[8] Max. Unit IODL Output LOW Current[11] VCC=5V, VIN=VIH or VIL, VOUT=1.5V 60 115 150 mA IODH Output HIGH Current[11] VCC=5V, VIN=VIH or VIL, VOUT=1.5V −60 −115 −150 mA VOH Output HIGH Voltage VCC=Min., IOH=−24 mA 2.4 3.3 V VOL Output LOW Voltage VCC=Min., IOL=24 mA 0.3 0.55 V Notes: 8. Typical values are at VCC= 5.0V, TA= +25˚C ambient. 9. This parameter is specified but not tested. 10. Pins with bus hold are described in Pin Description. 11. Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter tests, IOS tests should be performed last. 12. Tested at +25˚C. |
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