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SN74ACT10D 데이터시트(PDF) 1 Page - Texas Instruments |
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SN74ACT10D 데이터시트(HTML) 1 Page - Texas Instruments |
1 / 5 page SN54ACT10, SN74ACT10 TRIPLE 3-INPUT POSITIVE-NAND GATES SCAS526A – AUGUST 1995 – REVISED APRIL 1996 1 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 D Inputs Are TTL-Voltage Compatible D EPIC ™ (Enhanced-Performance Implanted CMOS) 1- µm Process D Package Options Include Plastic Small-Outline (D), Shrink Small-Outline (DB), and Thin Shrink Small-Outline (PW) Packages, Ceramic Chip Carriers (FK) and Flatpacks (W), and Standard Plastic (N) and Ceramic (J) DIPS description The ’ACT10 contain three independent 3-input NAND gates. The devices perform the Boolean functions Y = A • B • C or Y = A + B + C in positive logic. The SN54ACT10 is characterized for operation over the full military temperature range of – 55 °C to 125 °C. The SN74ACT10 is characterized for operation from – 40 °C to 85°C. FUNCTION TABLE (each gate) INPUTS OUTPUT A B C Y H H H L L XX H X LX H X X L H logic symbol† logic diagram, each gate (positive logic) 1 1A 2 1B 1Y 12 13 1C 2Y 6 3Y 8 & 3 2A 4 2B 5 2C 11 3A 10 3B 9 3C 12 1Y 1A 1B 1C 6 2Y 2A 2B 2C 8 3Y 3A 3B 3C 1 2 13 3 4 5 11 10 9 † This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12. Pin numbers shown are for the D, DB, J, N, PW, and W packages. Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. SN54ACT10 ... J OR W PACKAGE SN74ACT10 ... D, DB, N, OR PW PACKAGE (TOP VIEW) 1 2 3 4 5 6 7 14 13 12 11 10 9 8 1A 1B 2A 2B 2C 2Y GND VCC 1C 1Y 3A 3B 3C 3Y 3 2 1 20 19 910 11 12 13 4 5 6 7 8 18 17 16 15 14 1Y NC 3A NC 3B 2A NC 2B NC 2C SN54ACT10 . . . FK PACKAGE (TOP VIEW) NC – No internal connection PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. Copyright © 1996, Texas Instruments Incorporated EPIC is a trademark of Texas Instruments Incorporated. |
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