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SN74F377ADW 데이터시트(PDF) 2 Page - Texas Instruments

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부품명 SN74F377ADW
상세설명  OCTAL D-TYPE FLIP-FLOP WITH CLOCK ENABLE
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SN74F377ADW 데이터시트(HTML) 2 Page - Texas Instruments

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SN74F377A
OCTAL D-TYPE FLIP-FLOP
WITH CLOCK ENABLE
SDFS018D – D2932, MARCH 1987 – REVISED OCTOBER 1993
2–2
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
logic symbol
13
5D
14
6D
17
7D
18
8D
1Q
2
2Q
5
3Q
6
4Q
9
1C2
CE
G1
1
11
CLK
2D
3
1D
4
2D
7
3D
8
4D
5Q
12
6Q
15
7Q
16
8Q
19
† This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.
logic diagram (positive logic)
1D
11
1Q
1D
C1
CLK
CE
1
3
2
To Seven Other Channels
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage range, VCC
– 0.5 V to 7 V
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input voltage range, VI (see Note 1)
– 1.2 V to 7 V
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input current range
– 30 mA to 5 mA
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Voltage range applied to any output in the high state
– 0.5 V to VCC
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Current into any output in the low state
40 mA
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Operating free-air temperature range
0
°C to 70°C
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Storage temperature range
– 65
°C to 150°C
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
‡ Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTE 1: The input-voltage ratings may be exceeded provided the input-current ratings are observed.


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