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SN75468 데이터시트(HTML) 1 Page - Texas Instruments

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부품명 SN75468
상세내용  DARLINGTON TRANSISTOR ARRAYS
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제조사  TI [Texas Instruments]
홈페이지  http://www.ti.com
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SN75468 데이터시트(HTML) 1 Page - Texas Instruments

   
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SN75468, SN75469
DARLINGTON TRANSISTOR ARRAYS
SLRS023B – DECEMBER 1976 – REVISED SEPTEMBER 1995
Copyright
© 1995, Texas Instruments Incorporated
3–1
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
HIGH-VOLTAGE HIGH-CURRENT DARLINGTON TRANSISTOR ARRAYS
500-mA Rated Collector Current (Single
Output)
High-Voltage Outputs . . . 100 V
Output Clamp Diodes
Inputs Compatible With Various Types of
Logic
Relay Driver Applications
Higher-Voltage Versions of ULN2003A and
ULN2004A, for Commercial Temperature
Range
description
The SN75468 and SN75469 are monolithic high-voltage, high-current Darlington transistor arrays. Each
consists of seven npn Darlington pairs that feature high-voltage outputs with common-cathode clamp diodes
for switching inductive loads. The collector-current rating of each Darlington pair is 500 mA. The Darlington pairs
may be paralleled for higher current capability. Applications include relay drivers, hammer drivers, lamp drivers,
display drivers (LED and gas discharge), line drivers, and logic buffers.
The SN75468 has a 2700-
Ω series base resistor for each Darlington pair for operation directly with TTL or 5-V
CMOS. The SN75469 has a 10.5-k
Ω series base resistor to allow its operation directly with CMOS or PMOS
that use supply voltages of 6 to 15 V. The required input current is below that of the SN75468.
logic symbol
logic diagram
7B
6B
5B
4B
3B
2B
1B
7C
6C
5C
4C
3C
2C
1C
COM
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4
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2
1
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7C
6C
5C
4C
3C
2C
1C
COM
7
6
5
4
3
2
1
7B
6B
5B
4B
3B
2B
1B
10
11
12
13
14
15
16
9
CLAMP
† This symbol is in accordance with ANSI/IEEE
Std91-1984 and IEC publication 617-12.
1
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16
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1B
2B
3B
4B
5B
6B
7B
E
1C
2C
3C
4C
5C
6C
7C
COM
(TOP VIEW)
D OR N PACKAGE
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.


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