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CDCM61002RHBT 데이터시트(PDF) 5 Page - Texas Instruments |
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CDCM61002RHBT 데이터시트(HTML) 5 Page - Texas Instruments |
5 / 34 page ELECTRICAL CHARACTERISTICS CDCM61002 www.ti.com.................................................................................................................................................... SCAS870B – FEBRUARY 2009 – REVISED JULY 2009 At VCC = 3 V to 3.6 V, TA = –40°C to +85°C, unless otherwise noted. CDCM61002 PARAMETER TEST CONDITIONS MIN TYP MAX UNIT LVCMOS Input Characteristics fIN Reference input frequency 21.875 28.47 MHz VIH Input high voltage 0.6VCC V VIL Input low voltage 0.4VCC V IIH Input high current VCC = 3.6 V, VIL = 0 V 200 µA IIL Input low current VCC = 3 V, VIH = 3.6 V –200 µA ΔV/ΔT Reference input edge rate 20% to 80% 0.75 V/ns DutyREF Reference input duty cycle 40 60 % LVCMOS Output Characteristics(1) (See Figure 9 and Figure 10) fOSC_OUT Bypass output frequency 21.875 28.47 MHz fOUT Output frequency 43.75 250 MHz VOH Output high voltage VCC = min to max, IOH = –100 µA VCC –0.5 V VOL Output low voltage VCC = min to max, IOL = 100 µA 0.3 V tRJIT RMS phase jitter 250 MHz (10 kHz to 20 MHz) 0.85 ps, RMS tSLEW-RATE Output rise/fall slew rate 20% to 80% 2.4 V/ns ODC Output duty cycle 45 55 % tSKEW Skew between outputs 50 ps ICC, fIN = 25 MHz, fOUT = 250 MHz, Device current, LVCMOS 120 140 mA LVCMOS CL = 5 pF LVPECL Output Characteristics(2) (See Figure 11 and Figure 12) fOUT Output frequency 43.75 683.264 MHz VOH Output high voltage VCC –1.18 VCC –0.73 V VOL Output low voltage VCC –2 VCC –1.55 V |VOD| Differential output voltage 0.6 1.23 V tRJIT RMS phase jitter 625 MHz (10 kHz to 20 MHz) 0.77 ps, RMS tR/tF Output rise/fall time 20% to 80% 175 ps ODC Output duty cycle 45 55 % tSKEW Skew between outputs 20 ps ICC, Device current, LVPECL fIN = 25 MHz, fOUT = 625 MHz 126 144 mA LVPECL (1) Figure 9 and Figure 10 show dc and ac test setups, respectively. Jitter measurements made using 25-MHz quartz crystal in. (2) Figure 11 and Figure 12 show dc and ac test setups, respectively. Jitter measurements made using 25-MHz quartz crystal in. Copyright © 2009, Texas Instruments Incorporated Submit Documentation Feedback 5 Product Folder Link(s): CDCM61002 |
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