전자부품 데이터시트 검색엔진 |
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ISL3178AEMW 데이터시트(PDF) 6 Page - Intersil Corporation |
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ISL3178AEMW 데이터시트(HTML) 6 Page - Intersil Corporation |
6 / 14 page 6 FN6887.1 May 6, 2009 Receiver Enable from Shutdown to Output High tZH(SHDN) RL = 1kΩ, CL = 15pF, SW = GND (Figure 6), (Notes 7, 9) Full - 240 500 ns Receiver Enable from Shutdown to Output Low tZL(SHDN) RL = 1kΩ, CL = 15pF, SW = VCC (Figure 6), (Notes 7, 9) Full - 240 500 ns NOTES: 2. All currents into device pins are positive; all currents out of device pins are negative. All voltages are referenced to device ground unless otherwise specified. 3. Supply current specification is valid for loaded drivers when DE = 0V. 4. Applies to peak current. See “Typical Performance Curves” starting on page 10 for more information. 5. When testing devices with the shutdown feature, keep RE = 0 to prevent the device from entering SHDN. 6. When testing devices with the shutdown feature, the RE signal high time must be short enough (typically <100ns) to prevent the device from entering SHDN. 7. Versions with a shutdown feature are put into shutdown by bringing RE high and DE low. If the inputs are in this state for less than 50ns, the parts are guaranteed not to enter shutdown. If the inputs are in this state for at least 600ns, the parts are guaranteed to have entered shutdown. See “Low Power Shutdown Mode” on page 10. 8. Keep RE = VCC, and set the DE signal low time >600ns to ensure that the device enters SHDN. 9. Set the RE signal high time >600ns to ensure that the device enters SHDN. 10. Δt SKEW is the magnitude of the difference in propagation delays of the specified terminals of two units tested with identical test conditions (VCC, temperature, etc.). 11. VCC ≥ 3.15V 12. Limits established by characterization and are not production tested. 13. If the Tx or Rx enable function isn’t needed, connect the enable pin to the appropriate supply (see “Pin Descriptions” on page 2) through a 1k Ω to 3k Ω resistor. 14. For wafer sale the switching test limits are established by characterization. Test Circuits and Waveforms FIGURE 1A. VOD AND VOC FIGURE 1B. VOD WITH COMMON MODE LOAD FIGURE 1. DC DRIVER TEST CIRCUITS Electrical Specifications Test Conditions: VCC = 3.0V to 3.6V; Unless Otherwise Specified. Typicals are at VCC = 3.3V, TA = +25°C, (Note 2). Parameters with MIN and/or MAX limits are 100% tested at +25°C, unless otherwise specified. Temperature limits established by characterization and are not production tested. PARAMETER SYMBOL TEST CONDITIONS TEMP (°C) MIN TYP MAX UNITS D DE DI VCC VOD VOC RL/2 RL/2 Z Y D DE DI VCC VOD 375 Ω 375 Ω Z Y RL = 60Ω VCM -7V TO +12V ISL3178AE |
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