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74HC2GU04 데이터시트(PDF) 7 Page - NXP Semiconductors |
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74HC2GU04 데이터시트(HTML) 7 Page - NXP Semiconductors |
7 / 15 page 74HC2GU04_1 © NXP B.V. 2006. All rights reserved. Product data sheet Rev. 01 — 6 October 2006 7 of 15 NXP Semiconductors 74HC2GU04 Dual unbuffered inverter 13. Additional characteristics Table 9. Measurement points Input Output VM VI tr = tf VM 0.5VCC GND to VCC 6.0 ns 0.5VCC Test data is given in Table 10. Definitions test circuit: RL = Load resistance. CL = Load capacitance including jig and probe capacitance. RT = Termination resistance should be equal to output impedance Zo of the pulse generator. Fig 6. Load circuitry for switching times mgk563 D.U.T VCC VCC VI VO RT RL = 1 kΩ CL 50 pF open PULSE GENERATOR Table 10. Test data Input Test VI tr, tf tPHL, tPLH GND to VCC 6 ns open VO is constant. Fig 7. Test set-up for measuring forward transconductance mna050 VCC Rbias = 560 kΩ input 0.47 µF 100 µF output A GND IO VI (f = 1 kHz) g fs I o ∆ V i ∆ --------- = |
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